المؤلفون: Ku, S.-H., Chen, K.-F., Chong, L.-H., Chen, Y.-J., Yeh, T.-H., Lin, S.-W., Han, T.-T., Zous, N.-K., Huang, I., Chen, M.-S., Lu, W.-P., Chen, K.-C., Lu, C.-Y.

المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 24(2):315-324 May, 2011

المؤلفون: Zous, N.-K., Wang, T., Yeh, C.-C., Tsai, C.-W., Huang, C.

المصدر: 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) Reliability physics Reliability Physics Symposium Proceedings, 1999. 37th Annual. 1999 IEEE International. :405-409 1999

Relation: 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual

المؤلفون: Zous, N.-K., Yin-Jen Chen, Chi-Yuan Chin, Tsai, W.-J., Tao-Cheng Lu, Ming-Shiang Chen, Wen-Pin Lu, Tahui Wang, Pan, S.C., Chih-Yuan Lu

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 51(5):720-725 May, 2004

المؤلفون: Ou, T. F., Tzeng, W. C., Tsai, C. H., Lee, G. D., Ku, S. H., Liu, C. H., Liu, K. W., Zous, N. K., Huang, S. W., Chen, M. S., Lu, W. P., Chen, K. C., Lu, C.-Y.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 32(6):734-736 Jun, 2011

المؤلفون: Lee, C. H., Tu, W. H., Chong, L. H., Gu, S. H., Chen, K.F., Chen, Y. J., Hsieh, J.Y., Huang, I. J., Zous, N. K., Han, T. T., Chen, M. S., Lu, W. P., Chen, K. C., Wang, Tahui, Lu, C.Y.

المصدر: 2009 International Symposium on VLSI Technology, Systems, and Applications VLSI Technology, Systems, and Applications, 2009. VLSI-TSA '09. International Symposium on. :150-151 Apr, 2009

Relation: 2009 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA)

المؤلفون: Lee, C. H., Tu, W. H., Gu, S. H., Wu, C.W., Lin, S. W., Yeh, T. H., Chen, K.F., Chen, Y. J., Hsieh, J. Y., Huang, I. J., Zous, N. K., Han, T. T., Chen, M. S., Lu, W. P., Chen, K. C., Wang, Tahui, Lu, C. Y.

المصدر: 2009 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2009 IEEE International. :891-892 Apr, 2009

Relation: 2009 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Lee, C. H., Wu, C. W., Lin, S. W., Yeh, T. H., Gu, S. H., Chen, K. F., Chen, Y. J., Hsieh, J. Y., Huang, I. J., Zous, N. K., Han, T. T., Chen, M. S., Lu, W. P., Wang, Tahui, Lu, C. Y.

المصدر: 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design Non-Volatile Semiconductor Memory Workshop, 2008 and 2008 International Conference on Memory Technology and Design. NVSMW/ICMTD 2008. Joint. :109-110 May, 2008

Relation: 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design

المؤلفون: Wang, T., Chang, T.-E., Chiang, L.-P., Wang, C.-H., Zous, N.-K., Huang, C.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 45(7):1511-1517 Jul, 1998

المؤلفون: Mu-Yi Liu, Yao-Wen Chang, Zous, N.-K., Ichen Yang, Tao-Cheng Lu, Tahui Wang, Wenchi Ting, Ku, J., Chih-Yuan Lu

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 25(7):495-497 Jul, 2004

المؤلفون: Lee, Chienying, Lee, C. H., Cheng, C. H., Chong, L. H., Chen, K. F., Chen, Y. J., Huang, J. S., Ku, S. H., Zous, N. K., Huang, I. J., Han, T. T., Chen, M. S., Lu, W. P., Chen, K. C., Wang, Tahui, Lu, Chih-Yuan

المصدر: Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications VLSI Technology, Systems and Applications (VLSI-TSA), 2011 International Symposium on. :1-2 Apr, 2011

Relation: 2011 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)