المؤلفون: Ghandar, A., Ahmed, A., Zulfiqar, S., Hua, Z., Hanai, M., Theodoropoulos, G.

المصدر: IEEE Access Access, IEEE. 9:35691-35708 2021

المؤلفون: Zulfiqar, S., Nadeem, H., Tahir, Z., Mazhar, M., Hasan, K.M.

المصدر: TENCON 2018 - 2018 IEEE Region 10 Conference Region 10 Conference, TENCON, 2018 - 2018 IEEE. :1913-1916 Oct, 2018

Relation: TENCON 2018 - 2018 IEEE Region 10 Conference

المؤلفون: Rehman, H., Rehman, S. T., Zulfiqar, S., Awan, S., Abid, Shahab^{Aff1, IDs4159802456873x_cor5}

المصدر: Scientific Reports. 14(1)

المؤلفون: Zulfiqar, S., Saad, A.A., Sharif, M.F.M., Samsudin, Z., Ali, M.Y.T., Ani, F.C., Ahmad, Z., Abdullah, M.K.

المصدر: In Microelectronics Reliability December 2021 127

المؤلفون: Sharif, S.^Aff1, Zaheer, S., Mumtaz, M. W., Sahin, O., Ahmad, S., Zulfiqar, S., Adnan, A., Khan, I. U.

المصدر: Russian Journal of Coordination Chemistry. 47(1):95-104

المؤلفون: Altaf, S., Ijaz, H., Haider, J., Naz, M., Aqeel, M., Ul-Hamid, A., Ikram, M., Zulfiqar, S., Ditta, S. A., Shahbaz, A., Ikram, M.^Aff4

المصدر: Applied Nanoscience. 10(11):4241-4254

المؤلفون: Zulfiqar, S., Saad, A. A., Ahmad, Z., Bachok, Z.

المصدر: International Journal of Automotive & Mechanical Engineering; Sep2023, Vol. 20 Issue 3, p10635-10648, 14p

مصطلحات موضوعية: CONDUCTIVE ink, ELECTRONIC equipment, YIELD stress, MODULUS of elasticity, ELECTRONIC paper, NANOINDENTATION

المؤلفون: Zulfiqar, S.

المصدر: International Multi Topic Conference, 2002. Abstracts. INMIC 2002. Multi Topic Conference, 2002. Abstracts. INMIC 2002. International. :62-62 2002

Relation: 2002 International Multi Topic Conference - Abstracts

المؤلفون: Zaman Bajwa, W.U., Ahmed, S.A., Zulfiqar, S., Abbas, A., Qayyum, A.

المصدر: IEEE Students Conference, ISCON '02. Proceedings. IEEE students conference Students Conference, 2002. ISCON '02. Proceedings. IEEE. 2:10-10 2002

Relation: Proceedings IEEE Students Conference. ISCON on 2002 on Emerging Technologies

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