المؤلفون: Guarino, L., Caglio, C., Villa, R., Zullino, L., Cecchetto, L.

المصدر: 2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2022 23rd International Conference on. :1-6 Apr, 2022

Relation: 2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)

المؤلفون: Annese, M., Montanini, P., Toia, F., Zullino, L., Contiero, C.

المصدر: 2006 IEEE International Symposium on Power Semiconductor Devices and IC's Power Semiconductor Devices and IC's, 2006. ISPSD 2006. IEEE International Symposium on. :1-4 2006

Relation: 2006 IEEE International Symposium on Power Semiconductor Devices and IC's (ISPSD)

المؤلفون: Blaho, M., Pogany, D., Gornik, E., Zullino, L., Morena, E., Stella, R., Andreini, A.

المصدر: 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. Reliability physics symposium Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International. :235-240 2003

Relation: International Reliability Physics Symposium

المؤلفون: Reggiani, S., Valdinoci, A., Colalongo, L., Rudan, M., Baccarani, G., Stricker, A., Illien, F., Felber, N., Fichtner, W., Mettler, S., Lindenkreuz, S., Zullino, L.

المصدر: International Conference on Simulation of Semiconductor Processes and Devices Simulation of semiconductor processes Simulation of Semiconductor Processes and Devices, 2002. SISPAD 2002. International Conference on. :15-20 2002

Relation: 2002 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2002)

المؤلفون: Di Biccari, L., Cerati, L., Pozzobon, F., Zullino, L., Morin, S., Pizzo, G., Boroni, A., Andreini, A.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 15(3):280-288 Sep, 2015

المؤلفون: Valdinoci, M., Ventura, D., Vecchi, M.C., Rudan, M., Baccarani, G., Illien, F., Stricker, A., Zullino, L.

المصدر: 1999 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD'99 (IEEE Cat. No.99TH8387) Simulation of semiconductor processes and devices Simulation of Semiconductor Processes and Devices, 1999. SISPAD '99. 1999 International Conference on. :27-30 1999

Relation: Proceedings of International Conference on Simulation of Semiconductor Process and Devices. SISPAD 99

المؤلفون: Blaho, M., Zullino, L., Wolf, H., Stella, R., Andreini, A., Gieser, H.A., Pogany, D., Gornik, E.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 4(3):535-541 Sep, 2004

المؤلفون: Fourneris, G., Bekkara, N., Benkoski, J., Zullino, L., Spatafora, D., Martino, G.

المصدر: Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference Design automation Design Automation Conference, 1993, with EURO-VHDL '93. Proceedings EURO-DAC '93., European. :178-183 1993

Relation: Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference

المؤلفون: Reggiani, S., Valdinoci, M., Colalongo, L., Rudan, M., Baccarani, G., Stricker, A.D., Illien, F., Felber, N., Fichtner, W., Zullino, L.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 49(3):490-499 Mar, 2002

المؤلفون: Heer, M., Bychikhin, S., Dubec, V., Pogany, D., Gornik, E., Dissegna, M., Cerati, L., Zullino, L., Andreini, A., Tazzoli, A., Meneghesso, G.

المصدر: 2006 Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD '06.. :275-284 Sep, 2006

Relation: 2006 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)