المؤلفون: Laguerre, J., Bocquet, M., Billoint, O., Martin, S., Coignus, J., Carabasse, C., Magis, T., Dewolf, T., Andrieu, F., Grenouillet, L.

المصدر: 2023 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2023 IEEE International. :1-4 May, 2023

Relation: 2023 IEEE International Memory Workshop (IMW)

المؤلفون: Bagundol, Robert Leemar M., Hora, Jefferson A., Oling, Emrys Leowhel

المصدر: 2022 IEEE 14th International Conference on Humanoid, Nanotechnology, Information Technology, Communication and Control, Environment, and Management (HNICEM) Humanoid, Nanotechnology, Information Technology, Communication and Control, Environment, and Management (HNICEM), 2022 IEEE 14th International Conference on. :1-6 Dec, 2022

Relation: 2022 IEEE 14th International Conference on Humanoid, Nanotechnology, Information Technology, Communication and Control, Environment, and Management (HNICEM)

المؤلفون: Zou, Peng, Bai, Xiqiong, Wu, Yingjie, Wu, Lifeng, Chen, Jianli

المصدر: 2019 IEEE 13th International Conference on ASIC (ASICON) ASIC (ASICON), 2019 IEEE 13th International Conference on. :1-4 Oct, 2019

Relation: 2019 IEEE 13th International Conference on ASIC (ASICON)

المؤلفون: Patel, Ravi, Xu, Kan, Friedman, Eby G., Raghavan, Praveen

المصدر: 2016 International Great Lakes Symposium on VLSI (GLSVLSI) Great Lakes Symposium on VLSI, 2016 International. :233-238 May, 2016

Relation: 2016 International Great Lakes Symposium on VLSI (GLSVLSI)

المؤلفون: Laguerre, J., Bocquet, Marc, Billoint, O., Martin, S., Coignus, J., Carabasse, C., Magis, T., Dewolf, T., Andrieu, F., Grenouillet, L.

المساهمون: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), IEEE

المصدر: IMW 2023-2023 IEEE International Memory Workshop
IMW 2023-2023 IEEE International Memory Workshop, IEEE, May 2023, Monterey (CA), United States. pp.1-4, ⟨10.1109/IMW56887.2023.10145972⟩

مصطلحات موضوعية: non-volatile memory FeRAM etched FeCAP compact model advanced technology nodes, non-volatile memory, FeRAM, compact model, etched FeCAP, advanced technology nodes, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4deb07b3b5c62743794bbac0d0551285
https://hal.science/hal-04130967

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المؤلفون: Alberto Bosio, Deepak Kumar Arora, S. Naudet, Balwant Singh, Arnaud Virazel, Navin Kumar Dayani, Darayus Adil Patel, Shahabuddin, Sanjay Kumar

المساهمون: STMicroelectronics [India] (ST-INDIA), STMicroelectronics [Crolles] (ST-CROLLES), TEST (TEST), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Conception et Test de Systèmes MICroélectroniques (SysMIC)

المصدر: ISQED
17th International Symposium & Exhibits on Quality Electronic Desgn
ISQED: International Symposium on Quality Electronic Design
ISQED: International Symposium on Quality Electronic Design, Mar 2016, Santa Clara, CA, United States. pp.295-300, ⟨10.1109/ISQED.2016.7479217⟩

مصطلحات موضوعية: Silicon, Engineering, Silicon on insulator, chemistry.chemical_element, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Tuning, Setup Time, law.invention, law, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Delays, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, fully depleted silicon on insulator, Flip-flop, Clocks, guard banding, Hold Time, setup analysis, Guard (information security), Process Variation, business.industry, Hold time, hold margins, size 28 nm, 020208 electrical & electronic engineering, FDSOI, Generators, 020202 computer hardware & architecture, silicon-on-insulator, integrated circuit testing, Process variation, Test Chip, chemistry, Ring oscillators, Timing Margins, test circuit, process variations, advanced technology nodes, Si, elemental semiconductors, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7dc9c3bcaab2f21f4947fe9b8b93028a
https://doi.org/10.1109/isqed.2016.7479217

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