المؤلفون: Kheirallah, Rida, Galliere, Jean-Marc, Azemard, Nadine, Ducharme, Gilles

المصدر: 2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS) Power and Timing Modeling, Optimization and Simulation (PATMOS), 2018 28th International Symposium on. :88-91 Jul, 2018

Relation: 2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)

المؤلفون: Beyreuther, A., Vogt, I., Nakamura, T., Fischer, G. G., Motamedi, B., Boir, C.

المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-4 Jul, 2018

Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Zhou, Qian, Zhang, Shifeng, Jie, Lu, Feng, Guangtao, Han, Yan, Han, Xiaoxia, Ray, C. C. Cheung

المصدر: 2016 2nd International Conference on Communication Control and Intelligent Systems (CCIS) Communication Control and Intelligent Systems (CCIS), 2016 2nd International Conference on. :177-180 Nov, 2016

Relation: 2016 2nd International Conference on Communication, Control & Intelligent Systems (CCIS)

المؤلفون: Jeon, H., Kim, Y.-B., Choi, M.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 59(5):1127-1133 May, 2010

المؤلفون: Diary R. SULAIMAN, Ibrahim I. HAMARASH, Muhammed A. IBRAHIM

المصدر: Zanco Journal of Pure and Applied Sciences, Vol 31, Iss s3, Pp 20-25 (2019)

مصطلحات موضوعية: Supply voltage scaling, threshold voltage scaling, switching network, body bias voltage., Technology, Science

وصف الملف: electronic resource

Relation: https://zancojournals.su.edu.krd/index.php/JPAS/article/view/3087; https://doaj.org/toc/2218-0230; https://doaj.org/toc/2412-3986

URL الوصول: https://doaj.org/article/02586559d0e040698eb522c50d82b6fe

المؤلفون: Nadine Azemard, Gilles R. Ducharme, Rida Kheirallah, Jean-Marc Galliere

المساهمون: Smart Integrated Electronic Systems (SmartIES), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), TEST (TEST), Département de Mathématiques (IREM), Université Montpellier 2 - Sciences et Techniques (UM2)

المصدر: 28th International Symposium on Power and Timing Modeling, Optimization and Simulation
PATMOS: Power And Timing Modeling, Optimization and Simulation
PATMOS: Power And Timing Modeling, Optimization and Simulation, Jul 2018, Platja d’Aro, Spain. pp.88-91, ⟨10.1109/PATMOS.2018.8464159⟩
PATMOS

مصطلحات موضوعية: Process variability, Computer science, Energy management, Transistor, CPU time, Biasing, Integrated circuit, Hardware_PERFORMANCEANDRELIABILITY, 7. Clean energy, [INFO.INFO-MO]Computer Science [cs]/Modeling and Simulation, law.invention, Power (physics), law, Electronic engineering, Hardware_INTEGRATEDCIRCUITS, FDSOI technology, Supply voltage, Body-bias voltage, Delay-Power compromise, Energy optimisation, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Efficient energy use, Voltage, Hardware_LOGICDESIGN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c211887939220f1c5dd66637314c4323
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01867809

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