المؤلفون: Johnson, Michael R.

المصدر: 2018 IEEE AUTOTESTCON IEEE AUTOTESTCON, 2018. :1-5 Sep, 2018

Relation: 2018 IEEE AUTOTESTCON

المؤلفون: Yuanzhang Su, Xinfeng Guo, Hang Luo, Jingyuan Wang, Zhen Liu

المصدر: Applied Sciences, Vol 14, Iss 6, p 2410 (2024)

مصطلحات موضوعية: boundary scan test, generation of test vectors, heuristic search, fault detection, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2076-3417/14/6/2410; https://doaj.org/toc/2076-3417

URL الوصول: https://doaj.org/article/3322638b3975487bab31760352994aaf

المؤلفون: Ison, C., Spurrier, R., Somintac, M., Asuncion, R.

المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-4 Jul, 2018

Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Xingna, Hou, Jun, Ma, Shouhong, Chen

المصدر: 2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) Electronic Measurement & Instruments (ICEMI), 2017 13th IEEE International Conference on. :384-387 Oct, 2017

Relation: 2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI)

المؤلفون: Shuming, Du, Yan, Wang, Zijian, Cao

المصدر: 2016 IEEE AUTOTESTCON IEEE AUTOTESTCON, 2016. :1-7 Sep, 2016

Relation: 2016 IEEE AUTOTESTCON

المؤلفون: Tsai, Meng-Ting, Huang, Shi-Yu, Tsai, Kun-Han, Cheng, Wu-Tung

المصدر: 2015 IEEE International Test Conference (ITC) Test Conference (ITC), 2015 IEEE International. :1-9 Oct, 2015

Relation: 2015 IEEE International Test Conference (ITC)

المؤلفون: Chen Shouhong, Hou Xingna, Wang Zhuang, Yan Xuelong, Xu Chuanpei

المصدر: 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) Electronic Measurement & Instruments (ICEMI), 2015 12th IEEE International Conference on. 01:218-222 Jul, 2015

Relation: 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI)

المؤلفون: Xiaopeng, Deng, Simao, Xu, Yong, Zhang

المصدر: 2013 IEEE 11th International Conference on Electronic Measurement & Instruments Electronic Measurement & Instruments (ICEMI), 2013 IEEE 11th International Conference on. 1:264-270 Aug, 2013

Relation: 2013 IEEE 11th International Conference on Electronic Measurement & Instruments (ICEMI)

المؤلفون: Huang, Chun-Ming, Yang, Chih-Chyau, Wu, Chien-Ming, Lin, Chih-Hsing, Chiu, Chun-Chieh, Liu, Yi-Jun, Chu, Chun-Chieh, Lin, Chun-Ping, Chien, Wei-De

المصدر: 2012 International Symposium on Intelligent Signal Processing and Communications Systems Intelligent Signal Processing and Communications Systems (ISPACS), 2012 International Symposium on. :802-805 Nov, 2012

Relation: 2012 International Symposium on Intelligent Signal Processing and Communications Systems (ISPACS 2012)

المؤلفون: Majeed, Mudassar, Ahlstrom, Daniel, Ingelsson, Urban, Carlsson, Gunnar, Larsson, Erik

المصدر: 2010 19th IEEE Asian Test Symposium Test Symposium (ATS), 2010 19th IEEE Asian. :159-162 Dec, 2010

Relation: 2010 19th Asian Test Symposium (ATS)