المؤلفون: Liu, Beisheng, Zhou, Yanmei, Lyu, Xiangru, Li, Hui, Wang, Chao, Zhu, Zhenmeng

المصدر: 2024 IEEE 6th Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC) Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC), 2024 IEEE 6th. 6:487-494 May, 2024

Relation: 2024 IEEE 6th Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC)

المؤلفون: Gataullin, A. M., Gubaev, D. F., Gataullina, R. V.

المصدر: 2024 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM) Industrial Engineering, Applications and Manufacturing (ICIEAM), 2024 International Conference on. :18-23 May, 2024

Relation: 2024 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM)

المؤلفون: Levko, Dmitry, Thiruppathiraj, Sudharshanaraj, Raja, Laxminarayan L.

المصدر: Journal of Applied Physics; 5/7/2024, Vol. 135 Issue 17, p1-9, 9p

مصطلحات موضوعية: ELECTRIC breakdown, BREAKDOWN voltage, ATMOSPHERIC pressure, TWO-dimensional models, MIXTURES, ELECTRONEGATIVITY

المؤلفون: Han, C., Liu, Y., Liu, K., Yuan, H., Du, F., Zhou, Y., Wang, S., Wang, Z., Tang, X., Song, Q., Zhang, Y.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(7):1261-1264 Jul, 2024

المؤلفون: Sehra, K., Chanchal, ., Malik, A., Kumari, V., Gupta, M., Mishra, M., Rawal, D.S., Saxena, M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(7):4072-4078 Jul, 2024

المؤلفون: Li, S., Wang, F., Ouyang, L., Chen, X., Yang, Z., Rozga, P., Li, J., Fofana, I.

المصدر: IEEE Transactions on Dielectrics and Electrical Insulation IEEE Trans. Dielect. Electr. Insul. Dielectrics and Electrical Insulation, IEEE Transactions on. 31(3):1296-1304 Jun, 2024

المؤلفون: Gurugubelli, V.K., Bhargav, P.N.S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(6):3823-3830 Jun, 2024

المؤلفون: Garba-Seybou, T., Bravaix, A., Federspiel, X., Hai, J., Diouf, C., Cacho, F.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(2):174-183 Jun, 2024

المؤلفون: Saito, W., NIshizawa, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(6):3590-3595 Jun, 2024

المؤلفون: Zhang, C., Lu, W., Gao, S., Liu, C., Li, Y.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(6):1060-1063 Jun, 2024