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1مؤتمر
المؤلفون: Su, Ping-Hsun, Li, Yiming
المصدر: 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) Nanotechnology (IEEE-NANO), 2016 IEEE 16th International Conference on. :812-815 Aug, 2016
Relation: 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO)
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2مؤتمر
المؤلفون: Medury, A., Mercha, K., Ritzenthaler, R., De Keersgieter, A., Chiarella, T., Collaert, N., Bhat, N., Bhat, K. N
المصدر: 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) Ultimate Integration on Silicon (ULIS), 2012 13th International Conference on. :113-116 Mar, 2012
Relation: 2012 13th International Conference on Ultimate Integration on Silicon (ULIS)
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3دورية أكاديمية
المؤلفون: Simoen, E., de Andrade, M. G. C., Aoulaiche, M., Collaert, N., Claeys, C.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 59(5):1272-1278 May, 2012
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4دورية أكاديمية
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 39(3):335-338 Mar, 2018
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5دورية أكاديمية
المؤلفون: Eng, Y., Hu, L., Chang, T., Hsu, S., Chiou, C.M., Wang, T., Yang, C., Cheng, O., Wang, C., Tseng, C.S., Huang, R., Lin, P., Lu, K., Chang, I., Lee, C., Wu, Y., Chang, M.
المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 6:207-213 2018
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6دورية أكاديمية
المؤلفون: Park, K., Min Kim, Y., Choi, B. -K., Han, K.-R., Lee, J.
المصدر: IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 7(4):427-433 Jul, 2008
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7دورية أكاديمية
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 38(7):839-842 Jul, 2017
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8مؤتمر
المؤلفون: Li, Yiming, Cheng, Hui-Wen
المصدر: 2012 IEEE International Meeting for Future of Electron Devices, Kansai Future of Electron Devices, Kansai (IMFEDK), 2012 IEEE International Meeting for. :1-2 May, 2012
Relation: 2012 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)
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9دورية أكاديمية
المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 29(3):209-216 Aug, 2016
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10دورية أكاديمية
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 36(7):648-650 Jul, 2015