المؤلفون: Song, K., Wang, W., Bao, B., Xie, W., Yu, J., Wang, R.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(4):5152-5161 Feb, 2024

المؤلفون: Li, Yi, Xu, Yang, Xiao, Xiaoting, Guan, Borui, Ge, Liang

المصدر: 2023 12th International Workshop on Advanced Ground Penetrating Radar (IWAGPR) Advanced Ground Penetrating Radar (IWAGPR), 2023 12th International Workshop on. :1-4 Jul, 2023

Relation: 2023 12th International Workshop on Advanced Ground Penetrating Radar (IWAGPR)

المؤلفون: Ma, Qiang^{Aff1, IDs1220502407548_cor1}, Zeng, Gaofei, Xiao, Henglin, Zhou, Xinlong

المصدر: KSCE Journal of Civil Engineering. 28(7):2647-2660

المؤلفون: He, Mingguang, Hu, Yiru, Li, Qian, Zhao, Yizheng, Wei, Jun, Zhang, Anan

المصدر: 2023 Panda Forum on Power and Energy (PandaFPE) Power and Energy (PandaFPE), 2023 Panda Forum on. :1188-1192 Apr, 2023

Relation: 2023 Panda Forum on Power and Energy (PandaFPE)

المؤلفون: GUO Chao, WANG Hanqing, LI Xinwang, CHENG Lichao

المصدر: Meikuang Anquan, Vol 54, Iss 8, Pp 90-98 (2024)

مصطلحات موضوعية: large buried depth, roof cutting pressure relief, high water material, joint control support, gob-side entry retaining, Mining engineering. Metallurgy, TN1-997

وصف الملف: electronic resource

Relation: https://www.mkaqzz.com/cn/article/id/1f179a22-2b5a-47c7-8b86-8ff43a740c32; https://doaj.org/toc/1003-496X

URL الوصول: https://doaj.org/article/20df40c4955a46ce86caefcb944438ea

المؤلفون: Liu, Ping^{Aff1, Aff2}, Liu, Quansheng^{Aff1, Aff2, IDs00603023035993_cor2}, Deng, Penghai^{Aff1, Aff2}, Bo, Yin^{Aff1, Aff2}, Xie, Xianqi^{Aff1, Aff2}

المصدر: Rock Mechanics and Rock Engineering. 57(2):1219-1243

المؤلفون: Tudorache, Adriana, Timmerberg, Josef, Mylvaganam, Saba, Stender, Manfred, Xiaozhong, Fang, Zhu, Lin

المصدر: 2021 30th Annual Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE) Education in Electrical and Information Engineering (EAEEIE), 2021 30th Annual Conference of the European Association for. :1-7 Sep, 2021

Relation: 2021 30th Annual Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE)

المؤلفون: Zhou, J., Qiu, K., Deng, B., Zhang, Z., Ye, G.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 71:1-10 2022

المؤلفون: Changxiang Wang, Huaibin Li, Meng Zhang, Changlong Liao, Shaojie Zhang

المصدر: Energy Science & Engineering, Vol 11, Iss 10, Pp 3317-3331 (2023)

مصطلحات موضوعية: arch beam structure, key layer structure, shallow buried depth, stability analysis, Technology, Science

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2050-0505

URL الوصول: https://doaj.org/article/c88c6a8ffbbe4e559565608fd24eb19c

المؤلفون: Tang, Li^Aff41, Huang, Baoming^Aff42, Jiang, Hai^Aff41, Huang, Jiahao^Aff41, Hao, Liangshou^Aff41, Xiong, Yinwu^Aff41, Yan, Zexin^Aff42, Li, Jiangtao^Aff42

المساهمون: Angrisani, Leopoldo, Series Editor^Aff1, Arteaga, Marco, Series Editor^Aff2, Panigrahi, Bijaya Ketan, Series Editor^Aff3, Chakraborty, Samarjit, Series Editor^Aff4, Chen, Jiming, Series Editor^Aff5, Chen, Shanben, Series Editor^Aff6, Chen, Tan Kay, Series Editor^Aff7, Dillmann, Rüdiger, Series Editor^Aff8, Duan, Haibin, Series Editor^Aff9, Ferrari, Gianluigi, Series Editor^Aff10, Ferre, Manuel, Series Editor^Aff11, Hirche, Sandra, Series Editor^Aff12, Jabbari, Faryar, Series Editor^Aff13, Jia, Limin, Series Editor^Aff14, Kacprzyk, Janusz, Series Editor^Aff15, Khamis, Alaa, Series Editor^Aff16, Kroeger, Torsten, Series Editor^Aff17, Li, Yong, Series Editor^Aff18, Liang, Qilian, Series Editor^Aff19, Martín, Ferran, Series Editor^Aff20, Ming, Tan Cher, Series Editor^Aff21, Minker, Wolfgang, Series Editor^Aff22, Misra, Pradeep, Series Editor^Aff23, Möller, Sebastian, Series Editor^Aff24, Mukhopadhyay, Subhas, Series Editor^Aff25, Ning, Cun-Zheng, Series Editor^Aff26, Nishida, Toyoaki, Series Editor^Aff27, Oneto, Luca, Series Editor^Aff28, Pascucci, Federica, Series Editor^Aff29, Qin, Yong, Series Editor^Aff30, Seng, Gan Woon, Series Editor^Aff31, Speidel, Joachim, Series Editor^Aff32, Veiga, Germano, Series Editor^Aff33, Wu, Haitao, Series Editor^Aff34, Zamboni, Walter, Series Editor^Aff35, Zhang, Junjie James, Series Editor^Aff36, Li, Jian, editor^Aff37, Xie, Kaigui, editor^Aff38, Hu, Jianlin, editor^Aff39, Yang, Qingxin, editor^Aff40

المصدر: The Proceedings of the 17th Annual Conference of China Electrotechnical Society : Volume II. 1013:1248-1256