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1دورية أكاديمية
المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(4):5152-5161 Feb, 2024
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2مؤتمر
المؤلفون: Li, Yi, Xu, Yang, Xiao, Xiaoting, Guan, Borui, Ge, Liang
المصدر: 2023 12th International Workshop on Advanced Ground Penetrating Radar (IWAGPR) Advanced Ground Penetrating Radar (IWAGPR), 2023 12th International Workshop on. :1-4 Jul, 2023
Relation: 2023 12th International Workshop on Advanced Ground Penetrating Radar (IWAGPR)
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3دورية أكاديمية
المؤلفون: Ma, QiangAff1, IDs1220502407548_cor1, Zeng, Gaofei, Xiao, Henglin, Zhou, Xinlong
المصدر: KSCE Journal of Civil Engineering. 28(7):2647-2660
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4مؤتمر
المؤلفون: He, Mingguang, Hu, Yiru, Li, Qian, Zhao, Yizheng, Wei, Jun, Zhang, Anan
المصدر: 2023 Panda Forum on Power and Energy (PandaFPE) Power and Energy (PandaFPE), 2023 Panda Forum on. :1188-1192 Apr, 2023
Relation: 2023 Panda Forum on Power and Energy (PandaFPE)
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5دورية أكاديمية
المؤلفون: GUO Chao, WANG Hanqing, LI Xinwang, CHENG Lichao
المصدر: Meikuang Anquan, Vol 54, Iss 8, Pp 90-98 (2024)
مصطلحات موضوعية: large buried depth, roof cutting pressure relief, high water material, joint control support, gob-side entry retaining, Mining engineering. Metallurgy, TN1-997
وصف الملف: electronic resource
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6دورية أكاديمية
المؤلفون: Liu, PingAff1, Aff2, Liu, QuanshengAff1, Aff2, IDs00603023035993_cor2, Deng, PenghaiAff1, Aff2, Bo, YinAff1, Aff2, Xie, XianqiAff1, Aff2
المصدر: Rock Mechanics and Rock Engineering. 57(2):1219-1243
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7مؤتمر
المؤلفون: Tudorache, Adriana, Timmerberg, Josef, Mylvaganam, Saba, Stender, Manfred, Xiaozhong, Fang, Zhu, Lin
المصدر: 2021 30th Annual Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE) Education in Electrical and Information Engineering (EAEEIE), 2021 30th Annual Conference of the European Association for. :1-7 Sep, 2021
Relation: 2021 30th Annual Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE)
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8دورية أكاديمية
المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 71:1-10 2022
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9دورية أكاديمية
المؤلفون: Changxiang Wang, Huaibin Li, Meng Zhang, Changlong Liao, Shaojie Zhang
المصدر: Energy Science & Engineering, Vol 11, Iss 10, Pp 3317-3331 (2023)
مصطلحات موضوعية: arch beam structure, key layer structure, shallow buried depth, stability analysis, Technology, Science
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2050-0505
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10كتاب إلكتروني
المؤلفون: Tang, LiAff41, Huang, BaomingAff42, Jiang, HaiAff41, Huang, JiahaoAff41, Hao, LiangshouAff41, Xiong, YinwuAff41, Yan, ZexinAff42, Li, JiangtaoAff42
المساهمون: Angrisani, Leopoldo, Series EditorAff1, Arteaga, Marco, Series EditorAff2, Panigrahi, Bijaya Ketan, Series EditorAff3, Chakraborty, Samarjit, Series EditorAff4, Chen, Jiming, Series EditorAff5, Chen, Shanben, Series EditorAff6, Chen, Tan Kay, Series EditorAff7, Dillmann, Rüdiger, Series EditorAff8, Duan, Haibin, Series EditorAff9, Ferrari, Gianluigi, Series EditorAff10, Ferre, Manuel, Series EditorAff11, Hirche, Sandra, Series EditorAff12, Jabbari, Faryar, Series EditorAff13, Jia, Limin, Series EditorAff14, Kacprzyk, Janusz, Series EditorAff15, Khamis, Alaa, Series EditorAff16, Kroeger, Torsten, Series EditorAff17, Li, Yong, Series EditorAff18, Liang, Qilian, Series EditorAff19, Martín, Ferran, Series EditorAff20, Ming, Tan Cher, Series EditorAff21, Minker, Wolfgang, Series EditorAff22, Misra, Pradeep, Series EditorAff23, Möller, Sebastian, Series EditorAff24, Mukhopadhyay, Subhas, Series EditorAff25, Ning, Cun-Zheng, Series EditorAff26, Nishida, Toyoaki, Series EditorAff27, Oneto, Luca, Series EditorAff28, Pascucci, Federica, Series EditorAff29, Qin, Yong, Series EditorAff30, Seng, Gan Woon, Series EditorAff31, Speidel, Joachim, Series EditorAff32, Veiga, Germano, Series EditorAff33, Wu, Haitao, Series EditorAff34, Zamboni, Walter, Series EditorAff35, Zhang, Junjie James, Series EditorAff36, Li, Jian, editorAff37, Xie, Kaigui, editorAff38, Hu, Jianlin, editorAff39, Yang, Qingxin, editorAff40
المصدر: The Proceedings of the 17th Annual Conference of China Electrotechnical Society : Volume II. 1013:1248-1256