المؤلفون: Luo, Qian, Wen, Houdong, Jiang, Xuanqing

المصدر: 2019 IEEE 2nd International Conference on Electronics and Communication Engineering (ICECE) Electronics and Communication Engineering (ICECE), 2019 IEEE 2nd International Conference on. :211-215 Dec, 2019

Relation: 2019 IEEE 2nd International Conference on Electronics and Communication Engineering (ICECE)

المؤلفون: Wu, W., Geng, H., Lin, F., Chen, S., Cao, R., Xu, C., Sun, G., Liu, S., Sun, W.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(1):421-424 Jan, 2021

المؤلفون: Beale, Hugh

المصدر: IDP: revista d'Internet, dret i política; Núm. 23 (desembre 2016)

مصطلحات موضوعية: derecho contractual europeo, contenidos digitales, compraventa de productos en línea, consumidores, armonización completa, contratos empresa-consumidor, armonización mínima, normativa común de compraventa europea, dret contractual europeu, continguts digitals, compravenda de productes en línia, consumidors, harmonització completa, contractes empresa-consumidor, harmonització mínima, normativa comuna de compravenda europea, European contract law, digital content, online sale of goods, consumers, full harmonisation, B2C contracts, minimum harmonisation, CESL

وصف الملف: application/pdf; application/epub+zip

Relation: https://www.raco.cat/index.php/IDP/article/view/329797/420416; https://www.raco.cat/index.php/IDP/article/view/329797/420417

URL الوصول: https://www.raco.cat/index.php/IDP/article/view/329797

المؤلفون: Chen, Shuxian, Lin, Feng, Yang, Bin, Li, Chunxu, Huang, Yu

المصدر: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2019 IEEE 26th International Symposium on. :1-4 Jul, 2019

Relation: 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Ping Wang, Weitian Chen, Jiahong Gao

المصدر: Frontiers in Physics, Vol 11 (2024)

مصطلحات موضوعية: magnetic resoance imaging (MRI), imaging biomakers, T1rho imaging, chemical exchange saturation transfer (CEST), mDixon MR, chemical exchange-sensitive spin-lock (CESL), Physics, QC1-999

وصف الملف: electronic resource

Relation: https://www.frontiersin.org/articles/10.3389/fphy.2023.1356574/full; https://doaj.org/toc/2296-424X

URL الوصول: https://doaj.org/article/eb6cdfe85725490c9c08ee215bb01c79

المؤلفون: Tsai, B. A., Chang, S. J., S.Ho, C., Chou, K. C., Wei, I. S., Tseng, P. H.

المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-4 Jul, 2018

Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Lee, C., Huang, P.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(11):4975-4981 Nov, 2018

المؤلفون: Hung-Wen Hsu, Lee, C.C.

المصدر: 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) Solid-State and Integrated Circuit Technology (ICSICT), 2016 13th IEEE International Conference on. :1242-1244 Oct, 2016

Relation: 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

المؤلفون: Gupta, Anshul, Gupta, Charu, Bansal, Anil K., Dixit, Abhisek

المصدر: 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC) Electron Devices and Solid-State Circuits (EDSSC), 2017 International Conference on. :1-2 Oct, 2017

Relation: 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC)

المؤلفون: Wang, Mu-Chun, Peng, Ssu-Hao, Wang, Shea-Jue, Yang, Hsin-Chia, Liao, Wen-Shiang, Li, Chao-Wang, Liu, Chuan-Hsi

المصدر: 2013 International Symposium on Next-Generation Electronics Next-Generation Electronics (ISNE), 2013 IEEE International Symposium on. :361-364 Feb, 2013

Relation: 2013 International Symposium on Next-Generation Electronics (ISNE)