المؤلفون: Akpudo, U.E., Jang-Wook, H.

المصدر: IEEE Access Access, IEEE. 8:175020-175034 2020

المؤلفون: Devi, D. Anjani Suputri^Aff40, Satyanarayana, Ch.^Aff41, Rekha, D. Sasi^Aff40

المساهمون: Angrisani, Leopoldo, Series Editor^Aff1, Arteaga, Marco, Series Editor^Aff2, Panigrahi, Bijaya Ketan, Series Editor^Aff3, Chakraborty, Samarjit, Series Editor^Aff4, Chen, Jiming, Series Editor^Aff5, Chen, Shanben, Series Editor^Aff6, Chen, Tan Kay, Series Editor^Aff7, Dillmann, Rüdiger, Series Editor^Aff8, Duan, Haibin, Series Editor^Aff9, Ferrari, Gianluigi, Series Editor^Aff10, Ferre, Manuel, Series Editor^Aff11, Hirche, Sandra, Series Editor^Aff12, Jabbari, Faryar, Series Editor^Aff13, Jia, Limin, Series Editor^Aff14, Kacprzyk, Janusz, Series Editor^Aff15, Khamis, Alaa, Series Editor^Aff16, Kroeger, Torsten, Series Editor^Aff17, Li, Yong, Series Editor^Aff18, Liang, Qilian, Series Editor^Aff19, Martín, Ferran, Series Editor^Aff20, Ming, Tan Cher, Series Editor^Aff21, Minker, Wolfgang, Series Editor^Aff22, Misra, Pradeep, Series Editor^Aff23, Möller, Sebastian, Series Editor^Aff24, Mukhopadhyay, Subhas, Series Editor^Aff25, Ning, Cun-Zheng, Series Editor^Aff26, Nishida, Toyoaki, Series Editor^Aff27, Pascucci, Federica, Series Editor^Aff28, Qin, Yong, Series Editor^Aff29, Seng, Gan Woon, Series Editor^Aff30, Speidel, Joachim, Series Editor^Aff31, Veiga, Germano, Series Editor^Aff32, Wu, Haitao, Series Editor^Aff33, Zamboni, Walter, Series Editor^Aff34, Zhang, Junjie James, Series Editor^Aff35, Satyanarayana, Ch., editor^Aff36, Samanta, Debasis, editor^Aff37, Gao, Xiao-Zhi, editor^Aff38, Kapoor, Rajiv Kumar, editor^Aff39

المصدر: High Performance Computing and Networking : Select Proceedings of CHSN 2021. 853:411-423

المؤلفون: Guangxun E, He Gao, Youfu Lu, Xuehan Zheng, Xiaoying Ding, Yuanhao Yang

المصدر: Energies, Vol 16, Iss 20, p 7105 (2023)

مصطلحات موضوعية: fault diagnosis, transmission line, comprehensive feature extraction, attention mechanism, temporal convolutional network, Technology

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1996-1073/16/20/7105; https://doaj.org/toc/1996-1073

URL الوصول: https://doaj.org/article/9b1839a49f2c438b8b10defe2bb309d2

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المؤلفون: Ugochukwu Ejike Akpudo, Hur Jang-Wook

المصدر: IEEE Access, Vol 8, Pp 175020-175034 (2020)

مصطلحات موضوعية: Binary particle swarm optimization, comprehensive feature extraction, continuous wavelet transform, Mel frequency cepstral coefficients, solenoid pumps, support vector machine, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9203804/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/7c2547c4abd146f6b661ec21e63d618d

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Hur Jang-Wook, Ugochukwu Ejike Akpudo

المصدر: IEEE Access, Vol 8, Pp 175020-175034 (2020)

مصطلحات موضوعية: General Computer Science, Computer science, Binary particle swarm optimization, Feature extraction, Feature selection, 02 engineering and technology, comprehensive feature extraction, Fault detection and isolation, Discriminative model, Robustness (computer science), solenoid pumps, 0202 electrical engineering, electronic engineering, information engineering, General Materials Science, support vector machine, continuous wavelet transform, Mel frequency cepstral coefficients, business.industry, 020208 electrical & electronic engineering, General Engineering, Condition monitoring, Pattern recognition, Filter (signal processing), Support vector machine, 020201 artificial intelligence & image processing, Artificial intelligence, lcsh:Electrical engineering. Electronics. Nuclear engineering, business, lcsh:TK1-9971

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6d4a9b470d19d4b2ce1f1b5b445f3a17
https://ieeexplore.ieee.org/document/9203804/

المؤلفون: Jing, Y., Liu, Z., Liu, Y., Yu, Z., Li, Y.

المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. PP(99):1-4