المؤلفون: Lukin, Kostyantyn, Khutoryan, Eduard, Cerdeira, Hilda A., Kuleshov, Alexei, Yurchenko, Lidia, Ponomarenko, Sergey

المصدر: 2023 International Conference on Optical MEMS and Nanophotonics (OMN) and SBFoton International Optics and Photonics Conference (SBFoton IOPC) Optical MEMS and Nanophotonics (OMN) and SBFoton International Optics and Photonics Conference (SBFoton IOPC), 2023 International Conference on. :1-4 Jul, 2023

Relation: 2023 International Conference on Optical MEMS and Nanophotonics (OMN) and SBFoton International Optics and Photonics Conference (SBFoton IOPC)

المؤلفون: Zozulia, Valerii, Botsula, Oleg, Prykhodko, Kyrylo, Sanin, Sergey, Katrich, Gennadiy, Fedosova, Svetlana

المصدر: 2022 IEEE 3rd KhPI Week on Advanced Technology (KhPIWeek) Advanced Technology (KhPIWeek), 2022 IEEE 3rd KhPI Week on. :1-4 Oct, 2022

Relation: 2022 IEEE 3rd KhPI Week on Advanced Technology (KhPIWeek)

المؤلفون: Garcia, R., Mejia, I., Tinoco, J., Molinar-Solis, J.E., Morales, A., Aleman, M., Sandoval, S., Quevedo-Lopez, M.A.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(5):1803-1809 May, 2018

المؤلفون: Rakitina, M. A.^Aff1, Brantov, A. V.

المصدر: Plasma Physics Reports. 47(10):1007-1013

المؤلفون: A. L. Danilyuk, A. G. Trafimenko, A. K. Fedotov, S. L. Prischepa

المصدر: Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 18, Iss 3, Pp 28-35 (2020)

مصطلحات موضوعية: current instability, delocalization, upper hubbard band, temperature coefficient of resistance, Electronics, TK7800-8360

وصف الملف: electronic resource

Relation: https://doklady.bsuir.by/jour/article/view/2665; https://doaj.org/toc/1729-7648

URL الوصول: https://doaj.org/article/d0e70dad09334adb8bc173f031013046

المؤلفون: Chenwei, Linfei

المساهمون: Zhejiang Ocean University

المصدر: The 28th International Ocean and Polar Engineering Conference.

الإتاحة: https://www.onepetro.org/conference-paper/ISOPE-I-18-396

المؤلفون: Romanovkii, V.R., Watanabe, K.

المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 20(3):2119-2121 Jun, 2010

المؤلفون: Martinez, Vincent, Besset, Carine, Monsieur, Frederic, Montes, Laurent, Ghibaudo, Gerard

المصدر: 2008 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International. :21-24 Oct, 2008

Relation: 2008 IEEE International Integrated Reliability Workshop Final Report (IRW)

المؤلفون: Vashchenko, V.A., LaFonteese, D.J., Korablev, K. G.

المصدر: 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting Bipolar/BiCMOS Circuits and Technology Meeting, 2008. BCTM 2008. IEEE. :53-56 Oct, 2008

Relation: 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM

المؤلفون: Shen, Liang-duo^{Aff1, Aff2}, Zou, Zhi-li, Zhao, Xi-zeng^Aff3

المصدر: China Ocean Engineering. 32(6):675-682