المؤلفون: Puranik, Vishal E., Gupta, Rajesh

المصدر: 2021 IEEE 48th Photovoltaic Specialists Conference (PVSC) Photovoltaic Specialists Conference (PVSC), 2021 IEEE 48th. :2372-2375 Jun, 2021

Relation: 2021 IEEE 48th Photovoltaic Specialists Conference (PVSC)

المؤلفون: Asadpour, R., Sulas-Kern, D.B., Johnston, S., Meydbray, J., Alam, M.A.

المصدر: IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 10(5):1409-1416 Sep, 2020

المؤلفون: Mundt, L.E., Kwapil, W., Yakoob, M.A., Herterich, J.P., Kohlstadt, M., Wurfel, U., Schubert, M.C., Glunz, S.W.

المصدر: IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 9(2):452-459 Mar, 2019

المؤلفون: Harvey, S.P., Aguiar, J.A., Hacke, P., Guthrey, H., Johnston, S., Al-Jassim, M.

المصدر: IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 6(6):1440-1445 Nov, 2016

المساهمون: Al-Jassim, Mowafak [National Renewable Energy Lab. (NREL), Golden, CO (United States)]

المصدر: IEEE Journal of Photovoltaics; 6; 6

وصف الملف: Medium: ED; Size: p. 1440-1445

URL الوصول: http://www.osti.gov/scitech/servlets/purl/1339517

المؤلفون: I Kafedjiska, G Farias Basulto, F Ruske, N Maticiuc, T Bertram, C A Kaufmann, R Schlatmann, I Lauermann

المصدر: JPhys Energy, Vol 5, Iss 2, p 024014 (2023)

مصطلحات موضوعية: monolithic CIGSe-perovskite tandem, morphological defect, ohmic shunt, dark lock-in thermography, X-ray/ultraviolet photoelectron spectroscopy (XPS/UPS), copper-doped nickel oxide (NiOx:Cu), Production of electric energy or power. Powerplants. Central stations, TK1001-1841, Renewable energy sources, TJ807-830

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2515-7655

URL الوصول: https://doaj.org/article/1ef44f7d69ce4dee90ced044920ee568

المؤلفون: Muller, S., von Wenckstern, H., Breitenstein, O., Lenzner, J., Grundmann, M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 59(3):536-541 Mar, 2012

المساهمون: Ahrenkiel, R

المصدر: Conference: Prepared for the 2008 FAll MRS conference, November 30 - December 5, Boston, Massachusetts

وصف الملف: Medium: ED; Size: 27 pp.

URL الوصول: http://www.osti.gov/scitech/servlets/purl/946342

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المؤلفون: Haitao Zheng, Linghao Zhou, Ryan Marks, Tuomas Happonen, Thomas M. Kraft

المصدر: Applied Sciences; Volume 12; Issue 4; Pages: 2005
Zheng, H, Zhou, L, Marks, R, Happonen, T & Kraft, T 2022, ' Defect Recognition of Roll-to-Roll Printed Conductors Using Dark Lock-In Thermography and Localized Segmentation ', Applied Sciences, vol. 12, no. 4, 2005 . https://doi.org/10.3390/app12042005

مصطلحات موضوعية: Fluid Flow and Transfer Processes, Process Chemistry and Technology, Dark lock-in thermography, General Engineering, Non-destructive testing, Automated defect recognition, Computer Science Applications, automated defect recognition, roll-to-roll, printing, organic photovoltaic, thin film, non-destructive testing, dark lock-in thermography, Roll-to-roll, Printing, General Materials Science, Organic photovoltaic, Thin film, SDG 7 - Affordable and Clean Energy, Instrumentation

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ef45677f0bfb60ad6b8ac1380f137050