المؤلفون: Subbarao, M.V., Rani, U.L.S., Sindhu, J.T.S., Kumar, G.P., Ravuri, V., N, S.

المصدر: 2023 International Conference on Applied Intelligence and Sustainable Computing (ICAISC) Applied Intelligence and Sustainable Computing (ICAISC), 2023 International Conference on. :1-7 Jun, 2023

Relation: 2023 International Conference on Applied Intelligence and Sustainable Computing (ICAISC)

المؤلفون: Russel, Newlin Shebiah^{Aff1, IDs1265202404786y_cor1}, Selvaraj, Arivazhagan

المصدر: Journal of Ambient Intelligence and Humanized Computing. 15(6):2909-2923

المؤلفون: Alhadhrami, Noura, Abobakr, Aisha, Alhammadi, Alanoud, Shatnawi, Maad

المصدر: 2023 Advances in Science and Engineering Technology International Conferences (ASET) Advances in Science and Engineering Technology International Conferences (ASET), 2023. :1-5 Feb, 2023

Relation: 2023 Advances in Science and Engineering Technology International Conferences (ASET)

المؤلفون: Maheswara Rao, V. V. R.^Aff18, Silpa, N.^Aff18, Reddy, Shiva Shankar^Aff19, Hussain, S. Mahaboob^Aff20, Bonthu, Sridevi^Aff20, Uppalapati, Padma Jyothi^Aff20

المساهمون: Akan, Ozgur, Editorial Board Member^Aff1, Bellavista, Paolo, Editorial Board Member^Aff2, Cao, Jiannong, Editorial Board Member^Aff3, Coulson, Geoffrey, Editorial Board Member^Aff4, Dressler, Falko, Editorial Board Member^Aff5, Ferrari, Domenico, Editorial Board Member^Aff6, Gerla, Mario, Editorial Board Member^Aff7, Kobayashi, Hisashi, Editorial Board Member^Aff8, Palazzo, Sergio, Editorial Board Member^Aff9, Sahni, Sartaj, Editorial Board Member^Aff10, Shen, Xuemin, Editorial Board Member^Aff11, Stan, Mircea, Editorial Board Member^Aff12, Jia, Xiaohua, Editorial Board Member^Aff13, Zomaya, Albert Y., Editorial Board Member^Aff14, Pareek, Prakash, editor^Aff15, Gupta, Nishu, editor^Aff16, Reis, M. J. C. S., editor^Aff17

المصدر: Cognitive Computing and Cyber Physical Systems : 4th EAI International Conference, IC4S 2023, Bhimavaram, Andhra Pradesh, India, August 4-6, 2023, Proceedings, Part I. 536:12-27

المؤلفون: Faisal, M., Alsulaiman, M., Arafah, M., Mekhtiche, M.A.

المصدر: IEEE Access Access, IEEE. 8:167985-167997 2020

المؤلفون: Faisal, M., Albogamy, F., Elgibreen, H., Algabri, M., Alqershi, F.A.

المصدر: IEEE Access Access, IEEE. 8:206770-206782 2020

المؤلفون: Mohammed Faisal, Mansour Alsulaiman, Mohammed Arafah, Mohamed Amine Mekhtiche

المصدر: IEEE Access, Vol 8, Pp 167985-167997 (2020)

مصطلحات موضوعية: Maturity detection, deep learning, date fruit classification, neural networks, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9195414/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/f69dd0c780fa4aa68c8a5e03f5400055

المؤلفون: Mohammed Faisal, Fahad Albogamy, Hebah Elgibreen, Mohammed Algabri, Fattoh Abdu Alqershi

المصدر: IEEE Access, Vol 8, Pp 206770-206782 (2020)

مصطلحات موضوعية: Date fruit type classification, date fruit maturity classification, deep learning, date fruit classification, neural networks, computer vision, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9258900/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/6313dda350994bab94df97ccb13e9fb6

المؤلفون: Fahad R. Albogamy, Fattoh Al-Qershi, Mohammed Faisal, Hebah ElGibreen, Mohammed Algabri

المصدر: IEEE Access, Vol 8, Pp 206770-206782 (2020)

مصطلحات موضوعية: General Computer Science, 01 natural sciences, computer vision, Residual neural network, Average recall, General Materials Science, Computer vision, Mathematics, business.industry, Deep learning, 010401 analytical chemistry, General Engineering, Date fruit type classification, deep learning, 04 agricultural and veterinary sciences, neural networks, Maturity (finance), date fruit classification, 0104 chemical sciences, Support vector machine, Weight estimation, Decision system, 040103 agronomy & agriculture, 0401 agriculture, forestry, and fisheries, date fruit maturity classification, lcsh:Electrical engineering. Electronics. Nuclear engineering, Artificial intelligence, business, F1 score, lcsh:TK1-9971

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::624c07e186b037698424d40a78b113ab
https://doi.org/10.1109/access.2020.3037948

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