المؤلفون: Peng, Y., Li, W., Zeng, S., Zhang, Y., Deng, Y., Peng, B., Liu, J., Yang, H., Zhang, G.

المصدر: IEEE Transactions on Dielectrics and Electrical Insulation IEEE Trans. Dielect. Electr. Insul. Dielectrics and Electrical Insulation, IEEE Transactions on. 30(4):1858-1867 Aug, 2023

المؤلفون: Gao, C., Peng, Y., Zhang, S., Zhang, B., Li, W., Li, L.

المصدر: IEEE Access Access, IEEE. 11:114582-114589 2023

المؤلفون: Gao, Chao, Peng, Yanan, Lu, Ming, Liu, Zehui, Zeng, Shiyin, Zhang, Guanjun

المصدر: 2021 IEEE 2nd China International Youth Conference on Electrical Engineering (CIYCEE) Electrical Engineering (CIYCEE), 2021 IEEE 2nd China International Youth Conference on. :1-6 Dec, 2021

Relation: 2021 IEEE 2nd China International Youth Conference on Electrical Engineering (CIYCEE)

المؤلفون: Shen, Hao, Deng, Yu, Zhou, Jun, Wang, Jian, Lei, Longwu, Xu, Jun, Wang, Xiaojie

المصدر: 2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE) High Voltage Engineering and Application (ICHVE), 2020 IEEE International Conference on. :1-4 Sep, 2020

Relation: 2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE)

المؤلفون: Chao Gao, Yanan Peng, Shiyao Zhang, Bo Zhang, Wendong Li, Lee Li

المصدر: IEEE Access, Vol 11, Pp 114582-114589 (2023)

مصطلحات موضوعية: Composite insulator, decay-like aging, transmission line, aging analysis, industrial CT, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10271296/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/c90e5f0852444eac82cc180590d7c591

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تسجيل الدخول للوصول الكامل.