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1مؤتمر
المؤلفون: U, Yamuna, M, Thresia M
المصدر: 2022 International Conference on Futuristic Technologies in Control Systems & Renewable Energy (ICFCR) Futuristic Technologies in Control Systems & Renewable Energy (ICFCR), 2022 International Conference on. :1-6 Jul, 2022
Relation: 2022 International Conference on Futuristic Technologies in Control Systems & Renewable Energy (ICFCR)
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2مؤتمر
المؤلفون: Xi, Yu, Tan, Tian, Zhang, Wangyou, Yang, Baochen, Yu, Kai
المصدر: ICASSP 2022 - 2022 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP) Acoustics, Speech and Signal Processing (ICASSP), ICASSP 2022 - 2022 IEEE International Conference on. :6652-6656 May, 2022
Relation: ICASSP 2022 - 2022 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)
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3مؤتمر
المؤلفون: Kim, Jonathan C., Lehman, Brad, Ball, Roy
المصدر: 2021 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2021 IEEE. :989-994 Jun, 2021
Relation: 2021 IEEE Applied Power Electronics Conference and Exposition (APEC)
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4
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5مؤتمرConservatism Comparison of State Estimation Error and Residual in Multiple Actuator Faults Detection
المؤلفون: Min, Bo, Tan, Junbo, Wang, Xueqian, Yang, Jun, Liang, Bin
المصدر: 2020 IEEE International Conference on Systems, Man, and Cybernetics (SMC) Systems, Man, and Cybernetics (SMC), 2020 IEEE International Conference on. :1385-1391 Oct, 2020
Relation: 2020 IEEE International Conference on Systems, Man, and Cybernetics (SMC)
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6كتاب إلكتروني
المؤلفون: Yamuna, U.Aff40, Thresia, M. M.Aff40
المساهمون: Angrisani, Leopoldo, Series EditorAff1, Arteaga, Marco, Series EditorAff2, Chakraborty, Samarjit, Series EditorAff3, Chen, Jiming, Series EditorAff4, Chen, Shanben, Series EditorAff5, Chen, Tan Kay, Series EditorAff6, Dillmann, Rüdiger, Series EditorAff7, Duan, Haibin, Series EditorAff8, Ferrari, Gianluigi, Series EditorAff9, Ferre, Manuel, Series EditorAff10, Hirche, Sandra, Series EditorAff11, Jabbari, Faryar, Series EditorAff12, Jia, Limin, Series EditorAff13, Kacprzyk, Janusz, Series EditorAff14, Khamis, Alaa, Series EditorAff15, Kroeger, Torsten, Series EditorAff16, Li, Yong, Series EditorAff17, Liang, Qilian, Series EditorAff18, Martín, Ferran, Series EditorAff19, Ming, Tan Cher, Series EditorAff20, Minker, Wolfgang, Series EditorAff21, Misra, Pradeep, Series EditorAff22, Möller, Sebastian, Series EditorAff23, Mukhopadhyay, Subhas, Series EditorAff24, Ning, Cun-Zheng, Series EditorAff25, Nishida, Toyoaki, Series EditorAff26, Oneto, Luca, Series EditorAff27, Panigrahi, Bijaya Ketan, Series EditorAff28, Pascucci, Federica, Series EditorAff29, Qin, Yong, Series EditorAff30, Seng, Gan Woon, Series EditorAff31, Speidel, Joachim, Series EditorAff32, Veiga, Germano, Series EditorAff33, Wu, Haitao, Series EditorAff34, Zamboni, Walter, Series EditorAff35, Zhang, Junjie James, Series EditorAff36, Siano, Pierluigi, editorAff37, Williamson, Sheldon, editorAff38, Beevi, Sabeena, editorAff39
المصدر: Intelligent Solutions for Smart Grids and Smart Cities : Select Proceedings of IPECS 2022. 1022:225-237
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7دورية أكاديمية
المؤلفون: Bader, A., Abed-Meraim, K., Alouini, M.
المصدر: IEEE Systems Journal Systems Journal, IEEE. 9(3):785-796 Sep, 2015
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8دورية أكاديمية
المؤلفون: So-Hyun Park, Sun-Woo Yun, So-Eun Jeon, Na-Eun Park, Hye-Yeon Shim, Yu-Rim Lee, Sun-Jin Lee, Tae-Rim Park, Na-Yeon Shin, Min-Jin Kang, Il-Gu Lee
المصدر: IEEE Access, Vol 10, Pp 20259-20269 (2022)
مصطلحات موضوعية: Advanced persistent threat, behavior-based detection, cyber-attack, detection criteria, remote live forensics, open source based EDR, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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9دورية أكاديمية
المؤلفون: Zhou, J., Chan, W.K., Schwartz, J.
المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 28(5):1-12 Aug, 2018
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10دورية أكاديمية
المؤلفون: Ko, J. M., Kim, C. O., Lee, S. J., Hong, J. P.
المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 23(2):273-283 May, 2010