المؤلفون: Andrea García-Junceda, Luca Puricelli, Andrea Valsesia, François Rossi, Pascal Colpo, Ana Ruiz-Moreno

المصدر: Metals, Vol 12, Iss 3, p 468 (2022)

مصطلحات موضوعية: microfabrication, membranes, focused ion beam, differential sputtering, micro-punch test, Mining engineering. Metallurgy, TN1-997

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2075-4701/12/3/468; https://doaj.org/toc/2075-4701

URL الوصول: https://doaj.org/article/19c82bc441c44fa29f68b7d38738ddf2

المؤلفون: Yves Fleming, Tom Wirtz

المصدر: Beilstein Journal of Nanotechnology, Vol 6, Iss 1, Pp 1091-1099 (2015)

مصطلحات موضوعية: alloy, atomic force microscopy (AFM), correlative microscopy, differential sputtering, in situ, multimodal imaging, nano-cluster, polymer blend, secondary ion mass spectrometry (SIMS), scanning probe microscopy (SPM), SIMS artefacts, sputter-induced effects, sputter rate, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2190-4286

URL الوصول: https://doaj.org/article/feb799dccf5a47f0a0dfabf9102cb493

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Nastja Mahne, Miha Čekada, Matjaž Panjan

المصدر: Coatings; Volume 12; Issue 10; Pages: 1541

مصطلحات موضوعية: sputtering, total sputtering yield, differential sputtering yield, SRIM simulations, spatial distribution of sputtered atoms, Materials Chemistry, Surfaces and Interfaces, Surfaces, Coatings and Films

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::85c1a54b9d29a6df4f234ce1b6979b72
https://doi.org/10.3390/coatings12101541

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Tom Wirtz, Yves Fleming

المصدر: Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology, Vol 6, Iss 1, Pp 1091-1099 (2015)

مصطلحات موضوعية: Materials science, sputter-induced effects, Analytical chemistry, General Physics and Astronomy, multimodal imaging, lcsh:Chemical technology, lcsh:Technology, Full Research Paper, Nanoclusters, scanning probe microscopy (SPM), SIMS artefacts, Scanning probe microscopy, chemistry.chemical_compound, secondary ion mass spectrometry (SIMS), Sputtering, alloy, Nanotechnology, General Materials Science, lcsh:TP1-1185, atomic force microscopy (AFM), differential sputtering, correlative microscopy, Electrical and Electronic Engineering, sputter rate, lcsh:Science, chemistry.chemical_classification, lcsh:T, in situ, Polymer, Cermet, polymer blend, lcsh:QC1-999, Secondary ion mass spectrometry, nano-cluster, Nanoscience, chemistry, lcsh:Q, Polymer blend, Polystyrene, lcsh:Physics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::34dc87952b57c8fb326a1ab31c9da9b4
http://europepmc.org/articles/PMC4464366

المؤلفون: Nishimura, Taichiro, Koizumi, Hiroyuki, Kuninaka, Hitoshi, Yamagiwa, Yoshiki

المصدر: 宇宙輸送シンポジウム: 講演集録 = Proceedings of Space Transportation Symposium.

مصطلحات موضوعية: Ion Engine, Sputtering, Differential Sputtering, Sticking, QCM

URL الوصول: https://explore.openaire.eu/search/publication?articleId=jairo_______::3942c6bd2961b6dc74499687e3b2fb39
http://id.nii.ac.jp/1696/00016767/

المساهمون: Haymann, P

المصدر: Compt. Rend., Ser. B 274: No. 1, 81-4(3 Jan 1972).; Other Information: Orig. Receipt Date: 31-DEC-72

وصف الملف: Medium: X

URL الوصول: http://www.osti.gov/scitech/biblio/4689717

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.