المؤلفون: Prakash, Goutam, Kumar, Vasanth, Sultana, Sabiha

المصدر: 2022 IEEE International Conference on Emerging Electronics (ICEE) Emerging Electronics (ICEE), 2022 IEEE International Conference on. :1-4 Dec, 2022

Relation: 2022 IEEE International Conference on Emerging Electronics (ICEE)

المؤلفون: Bulakh, Dmitry A., Korshunov, Andrey V., Bespalov, Vladimir A.

المصدر: 2021 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus) Electrical and Electronic Engineering (ElConRus), 2021 IEEE Conference of Russian Young Researchers in. :2626-2631 Jan, 2021

Relation: 2021 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus)

المؤلفون: Tannor, Salamatu J.^{Aff1, Aff3, IDs43546023005153_cor1}, Borgemeister, Christian, Addo–Danso, Shalom D., Greve, Klaus, Tischbein, Bernhard

المصدر: SN Business & Economics. 3(8)

المؤلفون: Getnet, Lamesgin Addisu^Aff16, Admassu, Bimrew Tamrat^Aff16

المساهمون: Akan, Ozgur, Editorial Board Member^Aff1, Bellavista, Paolo, Editorial Board Member^Aff2, Cao, Jiannong, Editorial Board Member^Aff3, Coulson, Geoffrey, Editorial Board Member^Aff4, Dressler, Falko, Editorial Board Member^Aff5, Ferrari, Domenico, Editorial Board Member^Aff6, Gerla, Mario, Editorial Board Member^Aff7, Kobayashi, Hisashi, Editorial Board Member^Aff8, Palazzo, Sergio, Editorial Board Member^Aff9, Sahni, Sartaj, Editorial Board Member^Aff10, Shen, Xuemin (Sherman), Editorial Board Member^Aff11, Stan, Mircea, Editorial Board Member^Aff12, Jia, Xiaohua, Editorial Board Member^Aff13, Zomaya, Albert Y., Editorial Board Member^Aff14, Berihun, Mulatu Liyew, editor^Aff15

المصدر: Advances of Science and Technology : 9th EAI International Conference, ICAST 2021, Hybrid Event, Bahir Dar, Ethiopia, August 27–29, 2021, Proceedings, Part II. 412:425-442

المؤلفون: Ye, Zhen, Wang, Yong, Gao, Zhanqi, Zhuang, Yunyi, Zhang, Siyuan, Hao, Yongqin, Feng, Yuan, Li, Zaijin, Li, Yang, Zhang, Jiabin, Wang, Xiaohua

المصدر: 2015 International Conference on Optoelectronics and Microelectronics (ICOM) Optoelectronics and Microelectronics (ICOM), 2015 International Conference on. :422-426 Jul, 2015

Relation: 2015 International Conference on Optoelectronics and Microelectronics (ICOM)

المؤلفون: Yasufumi Miura, Kenji Suzuki, Satoshi Morooka, Takahisa Shobu

المصدر: Quantum Beam Science, Vol 8, Iss 1, p 1 (2023)

مصطلحات موضوعية: welding residual stress, austenitic stainless steel, synchrotron X-ray, neutron, double-exposure method, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2412-382X/8/1/1; https://doaj.org/toc/2412-382X

URL الوصول: https://doaj.org/article/927b113cf45c4a2887932f3b7eb08b56

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Shanmugan, S., Krishnamoorthi, G.

المصدر: 2013 International Conference on Energy Efficient Technologies for Sustainability Energy Efficient Technologies for Sustainability (ICEETS), 2013 International Conference on. :78-86 Apr, 2013

Relation: 2013 International Conference on Energy Efficient Technologies for Sustainability (ICEETS)

المؤلفون: Naglik, Janet^Aff3, Fay, Guadalupe Garcia^Aff4

المساهمون: DePaola, Louis G., editor^Aff1, Grant, Leslie E., editor^Aff2

المصدر: Infection Control in the Dental Office : A Global Perspective. :119-138

المؤلفون: Songsong Xiong, Shuner Chen, Yang Ran, Wei ping Liu

المصدر: Advances in Optoelectronics and Micro/nano-optics Advances in Optoelectronics and Micro/Nano-Optics (AOM), 2010 OSA-IEEE-COS. :1-4 Dec, 2010

Relation: 2010 OSA-IEEE-COS Advances in Optoelectronics and Micro/Nano-Optics (AOM)