المؤلفون: Cascino, Salvatore, Saggio, Mario, Imbruglia, Antonio, Scrimizzi, Filippo, Pulvirenti, Mario, Tumminia, Alessandro, Sicurella, Gaetano, Magagnini, Vincenzo Alessandro, Paparo, Mario

المصدر: 2024 IEEE International Symposium on Measurements & Networking (M&N) Measurements & Networking (M&N), 2024 IEEE International Symposium on. :1-6 Jul, 2024

Relation: 2024 IEEE International Symposium on Measurements & Networking (M&N)

المؤلفون: Rosa, Manuela La, Sicurella, Giovanni, D'Angelo, Salvatore, Patti, Davide, Nicolosi, Donata

المصدر: 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE) Industrial Electronics (ISIE), 2023 IEEE 32nd International Symposium on. :1-4 Jun, 2023

Relation: 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)

المؤلفون: Letor, Romeo, Crisafulli, Roberto

المصدر: 2019 AEIT International Conference of Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE), 2019 AEIT International Conference of. :1-6 Jul, 2019

Relation: 2019 AEIT International Conference of Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE)

المؤلفون: Deng, Libao, Sun, Ning, Fu, Ning, Qiao, Liyan

المصدر: 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2019 IEEE International. :1-6 May, 2019

Relation: 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

المؤلفون: Cheng, S., Huang, P., Wang, L., Chang, M.F.

المصدر: IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 36(6):63-71 Dec, 2019

المؤلفون: Rishith Kumar Vogeti, Sriman Pankaj Boindala, D. Nagesh Kumar, K. Srinivasa Raju

المصدر: Journal of Water and Climate Change, Vol 13, Iss 11, Pp 3934-3950 (2022)

مصطلحات موضوعية: climate change, e-fuse, kca, runoff, ssp, topsis, Environmental technology. Sanitary engineering, TD1-1066, Environmental sciences, GE1-350

وصف الملف: electronic resource

Relation: http://jwcc.iwaponline.com/content/13/11/3934; https://doaj.org/toc/2040-2244; https://doaj.org/toc/2408-9354

URL الوصول: https://doaj.org/article/ac3b53e9da8c4044ba6c322589b80e45

المؤلفون: Chung, Shine, Fang, Wen-Kuan, Hsu, YC, Hsiao, JY, Lin, Lupin, Yu, Wen-Hua

المصدر: 2016 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2016 International Conference on. :148-151 Mar, 2016

Relation: 2016 International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Guangyan Zhao, Yong Zhao, Chien, Wei-Ting Kary

المصدر: 2017 China Semiconductor Technology International Conference (CSTIC) Semiconductor Technology International Conference (CSTIC), 2017 China. :1-3 Mar, 2017

Relation: 2017 China Semiconductor Technology International Conference (CSTIC)

المؤلفون: Ghosh, Prokash, John, Celia, Gupta, Ajay, Siripurapu, Veerabhadrarao

المصدر: 2013 International Symposium on Electronic System Design Electronic System Design (ISED), 2013 International Symposium on. :153-157 Dec, 2013

Relation: 2013 International Symposium on Electronic System Design (ISED)

المؤلفون: Linewih, Handoko, Lee, Jian-Hsing, Marimuthu, Sevashanmugam, Chan, Tze-Ho

المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :PM-1.1-PM-1.4 Apr, 2017

Relation: 2017 IEEE International Reliability Physics Symposium (IRPS)