المؤلفون: Bouis, Renan, Marchand, Jeremy, Andre, Agathe, Borel, Stephan, Dechamp, Jerome, Vignoud, Lionel, Valentin, Paul, Assous, Myriam, Hebras, Damien

المصدر: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2024 IEEE 74th. :370-377 May, 2024

Relation: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC)

المؤلفون: Chow, Y., Chao, S., Jiang, P., Chang, C., Zheng, M., Wang, M., Lin, C., Chen, C., Liu, K.

المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 37(2):185-189 May, 2024

المؤلفون: Gao, Haoyu, Qi, Tianrun, Ren, Hanwen, Li, Qingmin, Ma, Yiqun, Xiao, Tao, Ma, Yidan, Wang, Wei

المصدر: 2024 9th Asia Conference on Power and Electrical Engineering (ACPEE) Power and Electrical Engineering (ACPEE), 2024 9th Asia Conference on. :1909-1913 Apr, 2024

Relation: 2024 9th Asia Conference on Power and Electrical Engineering (ACPEE)

المؤلفون: Dubey, M., Chaudhary, S., Patel, C., Mahapatra, B., Kumar, S., Kumar, P., Yamamoto, M.T.H., Mukherjee, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(2):1115-1121 Feb, 2024

المؤلفون: Likhachev, D. V.

المصدر: Journal of Applied Physics; 11/14/2023, Vol. 134 Issue 18, p1-15, 15p

مصطلحات موضوعية: ELLIPSOMETRY, SENSITIVITY analysis, OPTICAL measurements, MULTILAYERED thin films, REFLECTOMETRY, GEOMETRIC modeling, THIN films

المؤلفون: Xue, P., Xie, D., Liu, Y., Zhang, R., Wang, Z., Wu, C.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(13):14732-14736 Jul, 2023

المؤلفون: Gao, Haoyu, Ren, Hanwen, Li, Qingmin, Qi, Tianrun, Ma, Yiqun, Xiao, Tao, Ma, Yidan

المصدر: 2023 IEEE/IAS Industrial and Commercial Power System Asia (I&CPS Asia) Industrial and Commercial Power System Asia (I&CPS Asia), 2023 IEEE/IAS. :1611-1614 Jul, 2023

Relation: 2023 IEEE/IAS Industrial and Commercial Power System Asia (I&CPS Asia)

المؤلفون: Vavrille, Benjamin, Vignoud, Lionel, Chapelon, Laurent-Luc, Estevez, Rafael

المصدر: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2023 34th Annual. :1-6 May, 2023

Relation: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

المؤلفون: Lewis, Christopher J., Marchio, Jacob D., Sellers, Drew, Hamilton, Michael C.

المصدر: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2023 IEEE 73rd. :2230-2234 May, 2023

Relation: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)

المؤلفون: Kuntman, Ertan

المساهمون: University/Department: Universitat de Barcelona. Departament de Física Aplicada

مرشدي الرسالة: Arteaga Barriel, Oriol, Canillas i Biosca, Adolf, Morenza Gil, José Luis

المصدر: TDX (Tesis Doctorals en Xarxa)

مصطلحات موضوعية: El·lipsometria, Elipsometría, Ellipsometry, Polarització (Llum), Polarización (Luz), Polarization (Light), Nanotecnologia, Nanotecnología, Nanotechnology, Òptica, Óptica, Optics, Coherència (Òptica), Coherencia óptica, Coherence (Optics), Ciències Experimentals i Matemàtiques

وصف الملف: application/pdf

URL الوصول: http://hdl.handle.net/10803/668367