يعرض 1 - 10 نتائج من 15,975 نتيجة بحث عن '"failure mechanism"', وقت الاستعلام: 1.77s تنقيح النتائج
  1. 1
    مؤتمر
    BGA electromigration behavior and why it has become the bottleneck

    المؤلفون: Labie, Riet, Nawghane, Chinmay, Tsiakos, Dimitrios, Mertens, Jan, Tremble, Eric, Graf, Richard, Sauter, Wolfgang

    المصدر: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2024 IEEE 74th. :678-684 May, 2024

    Relation: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC)

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  2. 2
    دورية أكاديمية
    Failure Mechanism and Predictive Modeling for Microbump Interconnects Drop Life Under Diverse Impact Angles in Advanced Packaging

    المؤلفون: Long, Y., Lv, M., He, H.

    المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(2):241-249 Jun, 2024

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  3. 3
    دورية أكاديمية
    Damage and Failure Analysis of Insulation Structure of Electromagnetic Coil Launcher in Multiphysics Environment

    المؤلفون: Yuantao, C., Qiuliang, W., Junsheng, C., Ling, X., Jian, S., Heyang, W.

    المصدر: IEEE Transactions on Dielectrics and Electrical Insulation IEEE Trans. Dielect. Electr. Insul. Dielectrics and Electrical Insulation, IEEE Transactions on. 31(3):1517-1524 Jun, 2024

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  4. 4
    مؤتمر
    Evaluation Method of Residual Life of Extended Stored Electronic Components Based on Electrical Parameter Degradation

    المؤلفون: Qiao, Yu, Zheng, Xiaoyan, Zhang, Sujuan, Zhang, Dongdong, Cui, Shuai

    المصدر: 2024 10th International Symposium on System Security, Safety, and Reliability (ISSSR) ISSSR System Security, Safety, and Reliability (ISSSR), 2024 10th International Symposium on. :38-43 Mar, 2024

    Relation: 2024 10th International Symposium on System Security, Safety, and Reliability (ISSSR)

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  5. 5
    دورية أكاديمية
    Failure Behavior and Mechanism of p-GaN Gate AlGaN/GaN HEMTs in the Third Quadrant Under Repetitive Surge Current Stress

    المؤلفون: Wang, X., Chen, W., Sun, R., Liu, C., Chen, X., Xia, Y., Xu, X., Wang, Z., Luo, P., Zhang, Y., Zhang, B.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(3):1694-1701 Mar, 2024

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  6. 6
    دورية أكاديمية
    Short-Circuit Failure Modes and Mechanism Investigation of Ohmic-Gate GaN HEMT

    المؤلفون: Jiang, X., Jiang, T., Zhang, S., Yuan, S., Yan, Z., Gong, X., Wang, J.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(3):1455-1463 Mar, 2024

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  7. 7
    مؤتمر
    The Comparison of the Reliability Performance of Different Top Metal Materials in MEMS Applications

    المؤلفون: Hein, Verena, Weide-Zaage, Kirsten, Clausner, Andre

    المصدر: 2024 Pan Pacific Strategic Electronics Symposium (Pan Pacific) Pan Pacific Strategic Electronics Symposium (Pan Pacific), 2024. :1-6 Jan, 2024

    Relation: 2024 Pan Pacific Strategic Electronics Symposium (Pan Pacific)

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  8. 8
    مؤتمر
    Sensor and Maintenance Strategy Evaluation for Boeing 767 Commercial Fleets

    المؤلفون: Rasaq, Lukmon, Ferguson, Korbin, Teasley, William, Xu, Max, Blond, Kyle E., Yadav, Om Prakash

    المصدر: 2024 Annual Reliability and Maintainability Symposium (RAMS) Reliability and Maintainability Symposium (RAMS), 2024 Annual. :1-6 Jan, 2024

    Relation: 2024 Annual Reliability and Maintainability Symposium (RAMS)

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  9. 9
    مؤتمر
    Research on the Failure Mechanism and Fault Analysis of Measuring Boxes in High Altitude Environment

    المؤلفون: Yuan, Shiwen, Xu, Jincheng, Yang, Qi, Wang, Rui, Zhang, Ming, Geng, Jie, Ren, Weining, Duan, Wei

    المصدر: 2023 IEEE International Conference on Electrical, Automation and Computer Engineering (ICEACE) Electrical, Automation and Computer Engineering (ICEACE), 2023 IEEE International Conference on. :712-717 Dec, 2023

    Relation: 2023 IEEE International Conference on Electrical, Automation and Computer Engineering (ICEACE)

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  10. 10
    مؤتمر
    Study on the Aging Service Performance of Fluorine Ether Rubber Sealing Rings for Aircraft Engines Considering Combined Operating Conditions

    المؤلفون: Zhang, Pengfei, Meng, Lihua, Wang, Ruping, Liu, Gaofei, Liu, Jiuqin

    المصدر: 2023 China Automation Congress (CAC) Automation Congress (CAC), 2023 China. :5933-5937 Nov, 2023

    Relation: 2023 China Automation Congress (CAC)

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