المؤلفون: Cournault, Berangere, Vedrenne, Luc, Felix, Teyagirwa Prudence, Arnaud, Erkel, Gregoire, Hattenberger, Hamdi, Jmal, Naji, Kharouf, Olivier, Etienne

المصدر: 2024 IEEE International Symposium on Biomedical Imaging (ISBI) Biomedical Imaging (ISBI), 2024 IEEE International Symposium on. :1-5 May, 2024

Relation: 2024 IEEE International Symposium on Biomedical Imaging (ISBI)

المؤلفون: Zhou, N., Xu, Y.

المصدر: IEEE Transactions on Power Delivery IEEE Trans. Power Delivery Power Delivery, IEEE Transactions on. 39(2):728-739 Apr, 2024

المؤلفون: Oulkhir, Fatima Zahra, Akhrif, Iatimad^{Aff1, IDs40964024006385_cor2}, El Jai, Mostapha^{Aff1, Aff2}

المصدر: Progress in Additive Manufacturing. :1-43

المؤلفون: Cotroneo, D., De Simone, L., Liguori, P., Natella, R.

المصدر: IEEE Transactions on Dependable and Secure Computing IEEE Trans. Dependable and Secure Comput. Dependable and Secure Computing, IEEE Transactions on. 19(3):1476-1491 Jun, 2022

المؤلفون: Ma, Zhenyu, Man, Ruidong^{Aff1, IDs12221023002599_cor2}, Yin, Dongdong, Cheng, Li, Ma, Wensuo, Jia, Chenhui

المصدر: Fibers and Polymers. 24(8):2835-2848

المؤلفون: Ahmadi, S., Poure, P., Saadate, S., Khaburi, D.A.

المصدر: IEEE Transactions on Industrial Informatics IEEE Trans. Ind. Inf. Industrial Informatics, IEEE Transactions on. 17(2):1100-1110 Feb, 2021

المؤلفون: Wang, Fayu^{Aff1, Aff2, IDs40069023005944_cor1}

المصدر: International Journal of Concrete Structures and Materials. 17(1)

المؤلفون: Martin, D., Beckett, C., Brown, J., Nielsen, S.

المصدر: IEEE Electrical Insulation Magazine IEEE Electr. Insul. Mag. Electrical Insulation Magazine, IEEE. 35(6):7-14 Jan, 2019

المؤلفون: Muhammad Akhsin Muflikhun, Tomohiro Yokozeki

المصدر: International Journal of Lightweight Materials and Manufacture, Vol 6, Iss 3, Pp 329-343 (2023)

مصطلحات موضوعية: Failure mode analysis, Electron microscope, Light microscope, Digital microscope, Online monitoring, Technology

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2588840423000112; https://doaj.org/toc/2588-8404

URL الوصول: https://doaj.org/article/2b5c0e1b4bae41438ad523e00af5f3d5

المؤلفون: Azzouz, Imen, Hammami, Inès, Brik, Kais^{Aff2, Aff3, IDs0020202201697z_cor3}, Ben Ammar, Faouzi

المصدر: Electrical Engineering: Archiv für Elektrotechnik. 105(2):775-795