يعرض 1 - 10 نتائج من 48 نتيجة بحث عن '"fit rate"', وقت الاستعلام: 1.06s تنقيح النتائج
  1. 1
    مؤتمر

    المؤلفون: Saxena, Nirmal, Lotfi, Atieh

    المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :324-333 Sep, 2022

    Relation: 2022 IEEE International Test Conference (ITC)

  2. 2
    مؤتمر

    المصدر: 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC), 2022 IEEE. :1-6 Jul, 2022

    Relation: 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)

  3. 3
    دورية أكاديمية

    المؤلفون: Bodmann, P.R., Oliveira, D., Rech, P.

    المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 69(9):2018-2026 Sep, 2022

  4. 4
    دورية أكاديمية

    المصدر: IEEE Transactions on Industry Applications IEEE Trans. on Ind. Applicat. Industry Applications, IEEE Transactions on. 58(3):2978-2986 Jun, 2022

  5. 5
    مؤتمر

    المصدر: 2021 IEEE International Parallel and Distributed Processing Symposium (IPDPS) IPDPS Parallel and Distributed Processing Symposium (IPDPS), 2021 IEEE International. :289-298 May, 2021

    Relation: 2021 IEEE International Parallel and Distributed Processing Symposium (IPDPS)

  6. 6
    مؤتمر

    المصدر: 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-6 Nov, 2020

    Relation: 2020 IEEE International Test Conference (ITC)

  7. 7
    مؤتمر

    المصدر: 2020 Annual Reliability and Maintainability Symposium (RAMS) Reliability and Maintainability Symposium (RAMS), 2020 Annual. :1-6 Jan, 2020

    Relation: 2020 Annual Reliability and Maintainability Symposium (RAMS)

  8. 8
    مؤتمر

    المصدر: 2019 IEEE International Test Conference (ITC) Test Conference (ITC), 2019 IEEE International. :1-6 Nov, 2019

    Relation: 2019 IEEE International Test Conference (ITC)

  9. 9
  10. 10