المؤلفون: Serafini, Patricio

المساهمون: University/Department: Universitat Jaume I. Escola de Doctorat

مرشدي الرسالة: Mora Seró, Iván, Barea, Eva M

المصدر: TDX (Tesis Doctorals en Xarxa)

مصطلحات موضوعية: Halide perovskites, Passivation, Stability, Additives, Strain, flash infrared annealing, Ciències

وصف الملف: application/pdf

URL الوصول: http://hdl.handle.net/10803/689515

المؤلفون: Ahn, S., Yu, J., Hwang, H., Song, M.S., Yu, D., Hwang, S., Chung, I., Choi, W.Y., Kim, H.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(8):4670-4676 Aug, 2024

المؤلفون: Li, C., Sun, C., Yang, J., Ni, K., Gong, X., Zhuo, C., Yin, X.

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 32(8):1380-1388 Aug, 2024

المؤلفون: Yoo, J., Jo, H., Shin, H.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(7):4146-4152 Jul, 2024

المؤلفون: Kim, J., Im, J., Oh, S., Shin, W., Jung, G., Lee, S., Lee, J.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(7):1369-1372 Jul, 2024

المؤلفون: Sun, H., Tong, H., Yue, Y., Qin, X.

المصدر: IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. 73(7):1738-1752 Jul, 2024

المؤلفون: Luo, J., Chen, M., Fan, L., Liu, H., Gao, L., Feng, G.

المصدر: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 71(7):3603-3607 Jul, 2024

المؤلفون: Chang, J.H., Woo, J.S., Sung, S., Song, K., Choi, W.Y.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(6):3985-3988 Jun, 2024

المؤلفون: Mei, Z., Cai, K., Shi, L., Li, J., Chen, L., Immink, K.A.S.

المصدر: IEEE Transactions on Communications IEEE Trans. Commun. Communications, IEEE Transactions on. 72(6):3425-3438 Jun, 2024

المؤلفون: Yu, X., He, J., Li, Q., Zhang, B., Wang, X., Wang, Q., Huo, Z.

المصدر: IEEE Embedded Systems Letters IEEE Embedded Syst. Lett. Embedded Systems Letters, IEEE. 16(2):146-149 Jun, 2024