المؤلفون: Pomeranz, I.

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(9):3118-3122 Sep, 2023

المؤلفون: Pomeranz, I.

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 31(9):1259-1268 Sep, 2023

المؤلفون: Iwata, Hiroshi^{Aff1, IDs10836024061284_cor1}, Yamasaki, Kokoro, Yamaguchi, Ken’ichi

المصدر: Journal of Electronic Testing: Theory and Applications. :1-12

المؤلفون: Pomeranz, I.

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 31(4):601-605 Apr, 2023

المؤلفون: Pomeranz, I.

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(1):341-345 Jan, 2023

المؤلفون: Pomeranz, I.

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 30(10):1543-1547 Oct, 2022

المؤلفون: Feng, Y., Zhou, G., Fu, M., Zhao, J., Jin, L.

المصدر: IEEE Transactions on Power Systems IEEE Trans. Power Syst. Power Systems, IEEE Transactions on. 37(2):1162-1172 Mar, 2022

المؤلفون: Nagesh, B, Chandra, B S Nikhil

المصدر: 2021 International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT) Recent Trends on Electronics, Information, Communication & Technology (RTEICT), 2021 International Conference on. :146-150 Aug, 2021

Relation: 2021 International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT)

المؤلفون: Chen, Ching-Yuan, Cheng, Ching-Hong, Huang, Jiun-Lang, Chakrabarty, Krishnendu

المصدر: 2020 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2020 IEEE. :1-6 May, 2020

Relation: 2020 IEEE European Test Symposium (ETS)

المؤلفون: Pomeranz, I., Lin, X.

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 29(2):423-433 Feb, 2021