المؤلفون: Cui, Zheng^Aff2

المساهمون: Cui, Zheng^Aff1

المصدر: Nanofabrication : Principles, Capabilities and Limits. :141-168

المؤلفون: Nico Klingner, Gregor Hlawacek, Paul Mazarov, Wolfgang Pilz, Fabian Meyer, Lothar Bischoff

المصدر: Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 1742-1749 (2020)

مصطلحات موضوعية: focused ion beam, gas field ion source, liquid metal alloy ion source, resolution, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2190-4286

URL الوصول: https://doaj.org/article/d73b8a7ab9a74a96ac524d3067633dc3

المؤلفون: Goldstein, Joseph I.^Aff7, Newbury, Dale E.^Aff8, Michael, Joseph R.^Aff9, Ritchie, Nicholas W. M.^Aff8, Scott, John Henry J.^Aff8, Joy, David C.^Aff10

المساهمون: Goldstein, Joseph I.^Aff1, Newbury, Dale E.^Aff2, Michael, Joseph R.^Aff3, Ritchie, Nicholas W.M.^Aff4, Scott, John Henry J.^Aff5, Joy, David C.^Aff6

المصدر: Scanning Electron Microscopy and X-Ray Microanalysis. :517-528

المؤلفون: Suzuki, Yusuke, Asai, Takayuki, Nagai, Shigekazu, Kajiwara, Kazuo, Hata, Koichi, Iwata, Tatsuo

المصدر: 25th International Vacuum Nanoelectronics Conference Vacuum Nanoelectronics Conference (IVNC), 2012 25th International. :1-2 Jul, 2012

Relation: 2012 25th International Vacuum Nanoelectronics Conference (IVNC)

المؤلفون: Bedrane, Djouher, Houel, Arnaud, Delobbe, Anne, Lagaize, Mehdi, Dumas, Philippe, Veesler, Stéphane, Salançon, E.

المساهمون: Centre Interdisciplinaire de Nanoscience de Marseille (CINaM), Aix Marseille Université (AMU)-Centre National de la Recherche Scientifique (CNRS), Région Sud et Orsay Physics

مصطلحات موضوعية: Condensed Matter - Materials Science, brightness, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], Materials Science (cond-mat.mtrl-sci), FOS: Physical sciences, 79.70.+q, Gas field ion source, Field ionisation, flow regime

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c097e9ef9645561407df4ddfab656d37
https://hal-amu.archives-ouvertes.fr/hal-04085803/document

المؤلفون: Gregor Hlawacek, Fabian Meyer, Lothar Bischoff, Wolfgang Pilz, Paul Mazarov, Nico Klingner

المصدر: Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 1742-1749 (2020)

مصطلحات موضوعية: focused ion beam, Materials science, Silicon, General Physics and Astronomy, chemistry.chemical_element, Substrate (electronics), lcsh:Chemical technology, lcsh:Technology, Focused ion beam, Full Research Paper, Ion, Neon, Physics::Plasma Physics, Nanotechnology, Collision cascade, lcsh:TP1-1185, gas field ion source, General Materials Science, Electrical and Electronic Engineering, lcsh:Science, lcsh:T, business.industry, resolution, lcsh:QC1-999, Ion source, liquid metal alloy ion source, Nanoscience, chemistry, Optoelectronics, lcsh:Q, business, lcsh:Physics, Field ion microscope

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cf46813a78e20d722be3db404bb2e7a8
https://doi.org/10.3762/bjnano.11.156

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المؤلفون: Klingner, N., Hlawacek, G., Mazarov, P., Pilz, W., Meyer, F., Bischoff, L.

المصدر: Beilstein Journal of Nanotechnology 11(2020), 1742-1749

مصطلحات موضوعية: Focused Ion Beam, Liquid Metal Alloy Ion Sources, Physics::Plasma Physics, resolution, Gas Field Ion Source, Physics::Atomic Physics, Helium Ion Microscope

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______4577::402704e8e86bd8b676f3f33d83fc6728
https://www.hzdr.de/publications/Publ-31376-1

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