يعرض 1 - 10 نتائج من 969 نتيجة بحث عن '"hafnium dioxide"', وقت الاستعلام: 1.58s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Effects of Hydrogen Doping on a-GIZO Thin-Film Transistors With Hafnium Dioxide Gate Insulators Formed by Atomic Layer Deposition at Different Temperatures

    المؤلفون: Ahn, I., Ju, B., Choi, S.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(3):1920-1925 Mar, 2024

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  2. 2
    مؤتمر
    A Compact Model for the Variable Switching Dynamics of HfO2 Memristors

    المؤلفون: Rathore, Manu, Weiss, Ryan J., Shawkat, Mst Shamim Ara, Rose, Garrett S., Liehr, Maximilian, Abedin, Minhaz, Rafiq, Sarah, Cady, Nathaniel C.

    المصدر: 2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS) Circuits and Systems (MWSCAS), 2022 IEEE 65th International Midwest Symposium on. :1-4 Aug, 2022

    Relation: 2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS)

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  3. 3
    دورية أكاديمية
    Degradation of the Properties of SOS Ferroelectric Pseudo-MOS Transistors after Irradiation with Fast Heavy Xe and Bi Ions

    المؤلفون: Popov, V. P.Aff1, IDS8756699023060122_cor1, Antonov, V. A., Volodin, V. A., Miakonkikh, A. V., Rudenko, K. V., Skuratov, V. A.

    المصدر: Optoelectronics, Instrumentation and Data Processing. 59(6):740-748

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  4. 4
    دورية أكاديمية
    Durable Ru Nanocrystal with HfO2 Modification for Acidic Overall Water Splitting

    المؤلفون: Xiangkai Kong, Jie Xu, Zhicheng Ju, Changle Chen

    المصدر: Nano-Micro Letters, Vol 16, Iss 1, Pp 1-16 (2024)

    مصطلحات موضوعية: Ruthenium, Hafnium dioxide, Oxygen evolution catalysis, Anti-oxidation, Technology

    وصف الملف: electronic resource

    Relation: https://doaj.org/toc/2311-6706; https://doaj.org/toc/2150-5551

    URL الوصول: https://doaj.org/article/2e65df9440a24dffb4c29e7afdfd6278

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  5. 5
    دورية أكاديمية
    Ferroelectricity Based Memory Devices: New-Generation of Materials and Applications

    المؤلفون: Hu, Yifan, Rabelo, Matheus, Kim, Taeyong, Cho, Jaewoong, Choi, Jiwon, Fan, Xinyi, Yi, JunsinAff2, IDs42341023004459_cor7

    المصدر: Transactions on Electrical and Electronic Materials. 24(4):271-278

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  6. 6
    مؤتمر
    Effect of Oxygen Vacancy on the Electronic Structure and Electrical Properties of HfO2/Si Interface

    المؤلفون: Yao, Jiachi, Qu, Guanghao, Zhao, Zhonghua, Zhang, Guowei, Min, Daomin, Liu, Jie, Li, Shengtao

    المصدر: 2020 International Symposium on Electrical Insulating Materials (ISEIM) Electrical Insulating Materials (ISEIM), 2020 International Symposium on. :425-428 Sep, 2020

    Relation: 2020 International Symposium on Electrical Insulating Materials (ISEIM)

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  7. 7
    مؤتمر
    Investigation of DC Parameters of Double Gate Tunnel Field Effect Transistor (DG- TFET) for different Gate Dielectrics

    المؤلفون: Rathore, S., Bairagi, I., Lakshmi, B.

    المصدر: 2020 International Conference for Emerging Technology (INCET) Emerging Technology (INCET), 2020 International Conference for. :1-3 Jun, 2020

    Relation: 2020 International Conference for Emerging Technology (INCET)

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  8. 8
    مؤتمر
    A New Simplified Model for HfO2-Based Memristor

    المؤلفون: Mladenov, Valeri

    المصدر: 2019 8th International Conference on Modern Circuits and Systems Technologies (MOCAST) Modern Circuits and Systems Technologies (MOCAST), 2019 8th International Conference on. :1-4 May, 2019

    Relation: 2019 8th International Conference on Modern Circuits and Systems Technologies (MOCAST)

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  9. 9
    مؤتمر
    Thin Photonic Crystals for Optical Characterization of Ultrathin Hafnium Dioxide in Mesoporous Layers

    المؤلفون: Kovacs, A., Mescheder, U.

    المصدر: 2018 IEEE SENSORS SENSORS, 2018 IEEE. :1-4 Oct, 2018

    Relation: 2018 IEEE SENSORS

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  10. 10
    دورية أكاديمية
    Isothermal section of the ZrO2–HfO2–Nd2O3 ternary phase diagram at 1100 °C

    المؤلفون: O.A. Korniienko, Yu.V. Yurchenko, O.I. Olifan, A.V. Samelyuk, M.V. Zamula

    المصدر: Hybrid Advances, Vol 4, Iss , Pp 100085- (2023)

    مصطلحات موضوعية: Phase equilibria, Zirconium dioxide, Hafnium dioxide, Solid solutions, Unit cell parameters, Technology

    وصف الملف: electronic resource

    Relation: http://www.sciencedirect.com/science/article/pii/S2773207X23000684; https://doaj.org/toc/2773-207X

    URL الوصول: https://doaj.org/article/2bc8cc9c214a48e18a64553fac5ac198

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