المؤلفون: Sun, Qingyang, Liu, Tingyi Leo

المصدر: 2024 IEEE 37th International Conference on Micro Electro Mechanical Systems (MEMS) Micro Electro Mechanical Systems (MEMS), 2024 IEEE 37th International Conference on. :658-660 Jan, 2024

Relation: 2024 IEEE 37th International Conference on Micro Electro Mechanical Systems (MEMS)

المؤلفون: Hashem Faezi, M., Peletier, R., Wilkinson, M.H.F.

المصدر: IEEE Access Access, IEEE. 12:72288-72302 2024

المؤلفون: Fan, Siyuan, Li, Li, Sun, Kuo, Zhang, Tong, Wang, Lu, Wang, Zuobin

المصدر: 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2023 IEEE International Conference on. :327-330 Jul, 2023

Relation: 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

المؤلفون: Zhao, Guowei^{Aff1, IDs13632024010889_cor1}, Li, Wei, Jin, Yu, Zhang, Yanqin, Zheng, Kaiqiang

المصدر: Metallography, Microstructure, and Analysis: Application and Innovation for Metals, Alloys, and Engineered Materials. 13(4):565-569

المؤلفون: Li, Linze^{Aff1, IDs42242024002960_cor1}, Jiang, Changqing^{Aff2, IDs42242024002960_cor2}, Li, Luming^{Aff2, Aff3}

المصدر: Bio-Design and Manufacturing. :1-10

المؤلفون: Alarcón, Antonio C., Gallardo, José M., Jiménez-Losada, Andrés^{Aff3, IDs00291024007797_cor3}

المصدر: OR Spectrum: Quantitative Approaches in Management. :1-24

المؤلفون: Du, Xiran, Li, Jinlei, Zhu, Bin, Zhu, Jia^{Aff1, Aff2, IDs1227402468201_cor4}

المصدر: Nano Research. 17(10):9202-9224

المؤلفون: Dang, Depeng^{Aff1, IDs10115024020612_cor1}, Guo, Bilin, Fang, Tingting, Zhang, Ying

المصدر: Knowledge and Information Systems: An International Journal. 66(6):3283-3302

المؤلفون: Irez, Alaeddin Burak, Bilgen Bagci, Merve

المصدر: Rapid Prototyping Journal, 2024, Vol. 30, Issue 6, pp. 1161-1169.

URL الوصول: http://www.emeraldinsight.com/doi/10.1108/RPJ-08-2023-0294

المؤلفون: Deng, H., Qin, Z., Wu, Q., Deng, R.H., Guan, Z., Hu, Y., Li, F.

المصدر: IEEE Transactions on Dependable and Secure Computing IEEE Trans. Dependable and Secure Comput. Dependable and Secure Computing, IEEE Transactions on. 20(2):1364-1377 Apr, 2023