يعرض 1 - 10 نتائج من 373 نتيجة بحث عن '"hot-carrier injection (HCI)"', وقت الاستعلام: 0.90s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Leakage Current and Hot-Carrier Injection in the Junctionless Nanowire FETs Enhanced by Tensile Mechanical Stress

    المؤلفون: Kumar, N., Gupta, A., Singh, P.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(7):4420-4423 Jul, 2024

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  2. 2
    مؤتمر
    Measurement of Aging Effect on an Analog Computing-In-Memory Macro in 28nm CMOS

    المؤلفون: Wang, Wei-Chun, Zhang, Shida, Sharma, Sudarshan, Lee, Minah, Mukhopadhyay, Saibal

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-4 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  3. 3
    مؤتمر
    Measurement of Aging Effect in a Digitally Controlled Inductive Voltage Regulator in 65nm

    المؤلفون: Zhang, Shida, Rahman, Nael Mizanur, Wang, Wei-Chun, Kidambi, Narasimha Vasishta, Tokunaga, Carlos, Mukhopadhyay, Saibal

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  4. 4
    مؤتمر
    Substrate Current Improvement and Investigation in Low Voltage Power Ldmos with A Novel Design

    المؤلفون: Xu, Zhaozhao, Tian, Tian, Fang, Mingxu, Song, Wan, Zhang, Yintong, Fang, Ziquan, Liu, Donghua, Chen, Hualun, Qian, Wensheng

    المصدر: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC) Science and Technology for Integrated Circuits (CSTIC), 2024 Conference of. :1-4 Mar, 2024

    Relation: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC)

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  5. 5
    مؤتمر
    Low Frequency Noise and Hot Carrier Degradation Characteristics on 55nm LP Platform

    المؤلفون: Wang, Gang, Hu, Crimson, Ding, Freya

    المصدر: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC) Science and Technology for Integrated Circuits (CSTIC), 2024 Conference of. :1-3 Mar, 2024

    Relation: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC)

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  6. 6
    دورية أكاديمية
    Self-Heating Mapping of the Experimental Device and Its Optimization in Advance Sub-5 nm Node Junctionless Multi-Nanowire FETs

    المؤلفون: Kumar, N., Pali, S., Gupta, A., Singh, P.

    المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(1):33-40 Mar, 2024

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  7. 7
    دورية أكاديمية
    Low-Temperature Deuterium Annealing for High-Performance and Reliable Poly-Si Channel Thin-Film Transistors

    المؤلفون: Kil, T., Kim, J., Ku, J., Wang, D., Jung, D., Kang, M., Park, J.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(2):1078-1083 Feb, 2024

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  8. 8
    دورية أكاديمية
    Electrothermal Effects on Hot Carrier Injection Reliability of n-Type FinFETs in Ring Oscillators

    المؤلفون: Min, Q., Li, E., Wang, Y., Chen, W.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(2):1191-1198 Feb, 2024

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  9. 9
    مؤتمر
    Recessed-Source/Drain Junctionless GAA MOSFETs and their Sensitivity to Temperature: A Machine learning based Analysis

    المؤلفون: Singh, Abhay Pratap, Kumar, Alok, Chaudhary, Bharat Singh, Tiwari, Gaurav, Baghel, R. K., Tirkey, Sukeshni

    المصدر: 2023 International Conference on Next Generation Electronics (NEleX) Next Generation Electronics (NEleX), 2023 International Conference on. :1-6 Dec, 2023

    Relation: 2023 International Conference on Next Generation Electronics (NEleX)

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  10. 10
    مؤتمر
    Repetitive Pulse Testing for LDMOS Transistor Reliability

    المؤلفون: Liu, Tianjiao, Cook, Michael, Kendrick, Chris

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :P50.RT-1-P50.RT-4 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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