يعرض 1 - 10 نتائج من 7,836 نتيجة بحث عن '"hot-carriers"', وقت الاستعلام: 1.58s تنقيح النتائج
  1. 1
    مؤتمر
    The Impact of Scaling on the Effects of Mixed-Mode Electrical Stress and Ionizing Radiation for 130-nm and 90-nm SiGe HBTs

    المؤلفون: Nergui, D., Hosseinzadeh, M., Mensah, Y. A., Lee, H. P., Sam, D. G., Li, K., Zhang, E. X., Fleetwood, D. M., Cressler, John D.

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-5 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  2. 2
    دورية أكاديمية
    High resolution far-infrared synchrotron spectroscopy of 2-furfural conformers: Fundamental and hot bands.

    المؤلفون: Chawananon, Sathapana, Goubet, Manuel, Pirali, Olivier, Georges, Robert, Roucou, Anthony, Hadj Said, Ikram, Senent, María Luisa, Cuisset, Arnaud, Asselin, Pierre

    المصدر: Journal of Chemical Physics; 7/7/2024, Vol. 161 Issue 1, p1-13, 13p

    مصطلحات موضوعية: FURFURAL, FOURIER transform spectrometers, ENERGY levels (Quantum mechanics), SYNCHROTRONS, SYNCHROTRON radiation, SPECTROMETRY, HOT carriers

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  3. 3
    مؤتمر
    Mission Profile Approach for the Calculation of GaN FET Reliability in Power Supply Applications (Invited)

    المؤلفون: Bahl, Sandeep R., Joh, Jungwoo, Yang, Fei

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-7 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  4. 4
    مؤتمر
    Non-conducting Hot carrier temperature activation and temperature sense effect

    المؤلفون: Federspiel, X., Diouf, C., Arunachalam, B., Roy, D., Cacho, F.

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  5. 5
    مؤتمر
    Impact of Lightly Doped Drain on Hot Carrier Degradation Variability in N-FETs and SRAM Cells

    المؤلفون: Teng, Qiao, Wu, Yongyu, Kang, Junzhe, Xu, Kai, Gao, Dawei

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-4 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  6. 6
    مؤتمر
    Anomalous Mixed-Mode Damage Effects in SiGe HBTs at Cryogenic Temperatures

    المؤلفون: Lee, Harrison P., Nergui, Delgermaa, Teng, Jeffrey W., Moody, Jackson P., Sepulveda-Ramos, Nelson E., Cressler, John D.

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-4 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  7. 7
    مؤتمر
    Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs

    المؤلفون: Qu, Yiming, Yan, Chu, Ding, Yaru, Zhao, Yi

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  8. 8
    دورية أكاديمية
    Study of Gain Spatial Nonuniformity in n-on-p and p-on-n 4H-SiC Avalanche Photodiodes

    المؤلفون: Li, T., Zhou, Y., Tao, X., Xu, W., Zhou, D., Ren, F., Chen, D., Zhang, R., Zheng, Y., Lu, H.

    المصدر: IEEE Photonics Technology Letters IEEE Photon. Technol. Lett. Photonics Technology Letters, IEEE. 36(7):465-468 Apr, 2024

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  9. 9
    دورية أكاديمية
    Unraveling the cation dependent carrier cooling and transient mobility in lead-free A3Sb2I9 perovskites.

    المؤلفون: Shukla, Ayushi, Kaur, Gurpreet, Babu, K. Justice, Bhatt, Himanshu, Ghosh, Hirendra N.

    المصدر: Journal of Chemical Physics; 6/28/2024, Vol. 160 Issue 24, p1-8, 8p

    مصطلحات موضوعية: RUBIDIUM, PEROVSKITE, PUMP probe spectroscopy, HOT carriers, CHEMICAL engineering, CARRIER density, OPTICAL spectroscopy, CHEMICAL properties

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  10. 10
    دورية أكاديمية
    Impacts of hot electron diffusion, electron–phonon coupling, and surface atoms on metal surface dynamics revealed by reflection ultrafast electron diffraction.

    المؤلفون: He, Xing, Ghosh, Mithun, Yang, Ding-Shyue

    المصدر: Journal of Chemical Physics; 6/14/2024, Vol. 160 Issue 22, p1-10, 10p

    مصطلحات موضوعية: ELECTRON-phonon interactions, HOT carriers, ELECTRON diffraction, SURFACE dynamics, METALLIC surfaces, ELECTRON diffusion

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