المؤلفون: Mukherjee, K., Efthymiou, L., Ledins, K., Popa, D., Wang, B., Song, Q., Zhang, Y., Longobardi, G., Udrea, F.

المصدر: 2023 International Semiconductor Conference (CAS) Semiconductor Conference (CAS), 2023 International. :89-92 Oct, 2023

Relation: 2023 International Semiconductor Conference (CAS)

المؤلفون: Wang, Xiaoyan, Pu, Jing, Abrenica, Jefferson, Ow, Alvin

المصدر: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-4 Jul, 2023

Relation: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Ha, Sungmock, Lee, S., Bae, GH., Lee, DS., Kim, S.H., Woo, BW., Lee, N-H, Lee, YS., Pae, S.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-7 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Sicre, Mathieu, Federspiel, Xavier, Roy, David, Mamby, Bastien, Coutier, Caroline, Calmon, Francis

المصدر: 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-5 Oct, 2022

Relation: 2022 IEEE International Integrated Reliability Workshop (IIRW)

المؤلفون: Cacho, F., Bravaix, A., Seybou, T. Garba, Pitard, H., Federspiel, X., Kumar, T., Giner, F., Michard, A., Celeste, D., Miller, B., Dhanda, V., Varshney, A., Tripathi, V., Kumar, J.

المصدر: 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-7 Oct, 2022

Relation: 2022 IEEE International Integrated Reliability Workshop (IIRW)

المؤلفون: Cheng, Ya-Chi, Tan, Pai-Yu, Wu, Cheng-Wen, Shieh, Ming-Der, Chuang, Chien-Hui, Liao, Gordon

المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :601-608 Sep, 2022

Relation: 2022 IEEE International Test Conference (ITC)

المؤلفون: Cheng, Ya-Chi, Tan, Pai-Yu, Wu, Cheng-Wen, Shieh, Ming-Der, Chuang, Chien-Hui, Liao, Gordon

المصدر: 2022 IEEE International Test Conference in Asia (ITC-Asia) ITC-ASIA Test Conference in Asia (ITC-Asia), 2022 IEEE International. :19-24 Aug, 2022

Relation: 2022 IEEE International Test Conference in Asia (ITC-Asia)

المؤلفون: Lin, Shian-Yu, Tan, Pai-Yu, Wu, Cheng-Wen, Shieh, Ming-Der, Chuang, Chien-Hui, Liao, Gordon

المصدر: 2022 IEEE International Test Conference in Asia (ITC-Asia) ITC-ASIA Test Conference in Asia (ITC-Asia), 2022 IEEE International. :25-30 Aug, 2022

Relation: 2022 IEEE International Test Conference in Asia (ITC-Asia)

المؤلفون: Mavinkurve, A., Rongen, R.T.H., van Soestbergen, M.

المصدر: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2022 IEEE 72nd. :446-454 May, 2022

Relation: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)

المؤلفون: Valenta, Vaclav, Loughnane, Gearoid, Espana, Cesar, Latti, Jouni, Barnes, Andrew, Roux, Jean-Philippe, del Rio, Oscar, Rubio-Cidre, Gorka, Ramirez-Torres, Mario, Serru, Veronique, Caille, Laurent

المصدر: 2022 17th European Microwave Integrated Circuits Conference (EuMIC) Microwave Integrated Circuits Conference (EuMIC), 2022 17th European. :41-43 Sep, 2022

Relation: 2022 17th European Microwave Integrated Circuits Conference (EuMIC)