المؤلفون: Li, F., Liang, Y., Zhang, Y., Huang, Y., Li, A., Zhu, Y., Yu, C., Wang, Y., Wu, S., Yu, G., Pei, Y., Zhang, B., Liu, W.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(6):3801-3804 Jun, 2024

المؤلفون: Li, F., Wu, S., Li, A., Zhu, Y., Cui, M., Gu, J., Zhang, P., Zhao, Y., Wen, H., Liu, W.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 12:457-463 2024

المؤلفون: Wu, Shiqiang, Li, Fan, Zhu, Yuhao, Huang, Yixiao, Yu, Chenruiyuan, Wang, Yubo, Chi, Xuan, Wen, Huiqing, Liu, Wen

المصدر: 2023 International Conference on IC Design and Technology (ICICDT) IC Design and Technology (ICICDT), 2023 International Conference on. :152-155 Sep, 2023

Relation: 2023 International Conference on IC Design and Technology (ICICDT)

المؤلفون: Park, Geonwoo, Kim, Keunhoi, Shin, Jeong Woo^{Aff2, Aff3}, Han, Geongu, Go, Dohyun^{Aff4, IDs11814024000352_cor5}, An, Jihwan^{Aff1, Aff2, Aff5, IDs11814024000352_cor6}

المصدر: Korean Journal of Chemical Engineering. 41(4):1249-1254

المؤلفون: Zulfiadi Zulhan, Baihaqi Hakim, Yopi Hendrawan, Taufiq Hidayat, Eky Febrian Hermansyah, Achmad Haerul Yusro, Alfian Luhur Pambudi

المصدر: Journal of Materials Research and Technology, Vol 30, Iss , Pp 5346-5355 (2024)

مصطلحات موضوعية: Hydrogen plasma reduction, Nickel leaching residue, Iron extraction, Sulfur removal, Mining engineering. Metallurgy, TN1-997

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2238785424009797; https://doaj.org/toc/2238-7854

URL الوصول: https://doaj.org/article/9c301496266d4a43b1a00bdb9cdd6702

المؤلفون: Peng, S. X.^{Aff1, IDs4160502300423y_cor1}, Ma, T. H., Wu, W. B., Cui, B. J., Zhang, A. L., Jiang, Y. X., Guo, Z. Y., Chen, J. E.

المصدر: Radiation Detection Technology and Methods. 7(4):545-549

المؤلفون: Wei, X., Zhang, X., Tang, W., Liu, W., Zhou, X., Ma, Y., Chen, T., Huang, X., Qian, H., Yu, G., Shen, W., Fan, Y., Zeng, Z., Wang, H., Cai, Y., Zhang, B.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 43(5):693-696 May, 2022

المؤلفون: Karabanov, Sergey M., Reginevich, Mikhail A.

المصدر: 2021 IEEE International Conference on Environment and Electrical Engineering and 2021 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe) Environment and Electrical Engineering and 2021 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe), 2021 IEEE International Conference on. :1-5 Sep, 2021

Relation: 2021 IEEE International Conference on Environment and Electrical Engineering and 2021 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe)

المؤلفون: Iraldo Sá Silveira, Estéfano Aparecido Vieira, Ramiro Conceição Nascimento, Adonias Ribeiro Franco Júnior, Jaime Alberto Sanchez Caceres

المصدر: Materials Research, Vol 27 (2024)

مصطلحات موضوعية: Hematite reduction, Hydrogen plasma, Solid-state reaction, Activation energy, Materials of engineering and construction. Mechanics of materials, TA401-492

وصف الملف: electronic resource

Relation: http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392024000100252&lng=en&tlng=en; http://www.scielo.br/pdf/mr/v27/1516-1439-mr-27-e20230496.pdf; https://doaj.org/toc/1516-1439

URL الوصول: https://doaj.org/article/568cc5d99c0745a2bbd5d7b9fbc3e648

المؤلفون: Udachin, Viktor^{Aff1, IDs11090023103467_cor1}, Wegewitz, Lienhard, Szafarska, Maik, Dahle, Sebastian^{Aff1, Aff2}, Gustus, René, Maus-Friedrichs, Wolfgang

المصدر: Plasma Chemistry and Plasma Processing. 43(5):957-974