يعرض 1 - 10 نتائج من 83,278 نتيجة بحث عن '"ion-beam"', وقت الاستعلام: 1.95s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Characterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing

    المؤلفون: Sacristan Barbero, M., Slipukhin, I., Cecchetto, M., Prelipcean, D., Aguiar, Y., Bilko, K., Emriskova, N., Waets, A., Coronetti, A., Kastriotou, M., Cazzaniga, C., Dodd, T., Saigne, F., Pouget, V., Garcia Alia, R.

    المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(8):1557-1564 Aug, 2024

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  2. 2
    مؤتمر
    HiFi-DRAM: Enabling High-fidelity DRAM Research by Uncovering Sense Amplifiers with IC Imaging

    المؤلفون: Marazzi, Michele, Sachsenweger, Tristan, Solt, Flavien, Zeng, Peng, Takashi, Kubo, Yarema, Maksym, Razavi, Kaveh

    المصدر: 2024 ACM/IEEE 51st Annual International Symposium on Computer Architecture (ISCA) ISCA Computer Architecture (ISCA), 2024 ACM/IEEE 51st Annual International Symposium on. :133-149 Jun, 2024

    Relation: 2024 ACM/IEEE 51st Annual International Symposium on Computer Architecture (ISCA)

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  3. 3
    مؤتمر
    An Investigation on Classical Methods and Unsupervised Deep Learning Algorithms for Image Segmentation in High Variance Images for Industrial Application

    المؤلفون: Henry, Nathan, Reiter, Tamas

    المصدر: 2024 35th Irish Signals and Systems Conference (ISSC) Signals and Systems Conference (ISSC), 2024 35th Irish. :1-6 Jun, 2024

    Relation: 2024 35th Irish Signals and Systems Conference (ISSC)

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  4. 4
    مؤتمر
    Room Temperature Bonding of CVD Polycrystalline Diamond Wafers to Semiconductor and Piezo-electric Single Crystalline Wafers

    المؤلفون: Suga, Tadatomo, Wang, Junsha, Yamamura, Kazuya, Kataoka, Izumi

    المصدر: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2024 IEEE 74th. :353-356 May, 2024

    Relation: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC)

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  5. 5
    مؤتمر
    Style Transfer and Pseudo-Label Filtering Improve Transferability in Cell Organelle Segmentation Scenarios

    المؤلفون: Seletkov, Dmitrii, Reis, Simon, Freytag, Alexander, Seibold, Constantin, Stiefelhagen, Rainer

    المصدر: 2024 IEEE International Symposium on Biomedical Imaging (ISBI) Biomedical Imaging (ISBI), 2024 IEEE International Symposium on. :1-4 May, 2024

    Relation: 2024 IEEE International Symposium on Biomedical Imaging (ISBI)

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  6. 6
    مؤتمر
    The fabrication of homo-epitaxial magnesium oxide films in buffer layers for coated conductors

    المؤلفون: Xue, Yan, Yu, Fei, Zeng, Qiming, Wang, Xiaoting, Chen, Xiaodan, Huang, Qinjin, Wen, Quan, Hou, Xin

    المصدر: 2024 7th International Conference on Electronics Technology (ICET) Electronics Technology (ICET), 2024 7th International Conference on. :69-73 May, 2024

    Relation: 2024 7th International Conference on Electronics Technology (ICET)

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  7. 7
    دورية أكاديمية
    A Comprehensive Approach Toward Achieving High-Efficiency CTGSSe-Based Solar Cells

    المؤلفون: Dubey, M., Kumar, S., Yadav, S., Patel, C., Chaudhary, S., Mukherjee, S.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(10):6098-6103 Oct, 2024

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  8. 8
    دورية أكاديمية
    Preparation of the S/TEM Lamella of Commercial REBa2Cu3O7-x Coated Conductors by FIB

    المؤلفون: Rijckaert, H.

    المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 34(7):1-7 Oct, 2024

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  9. 9
    دورية أكاديمية
    545-mA/mm E-Mode Recessed-Gate GaN MOSHEMT (Vth > 4 V) by Ion Beam Etching

    المؤلفون: Gao, H., Gu, Y., Zhang, Y., Li, J., Zhou, J., Guo, H., Lau, K.M., Zou, X.

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(6):968-971 Jun, 2024

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  10. 10
    دورية أكاديمية
    Study of Space Charge Potential for Propagation of Plasma-Assisted Electron Beam

    المؤلفون: Unadkat, P., Kumar, N.

    المصدر: IEEE Transactions on Plasma Science IEEE Trans. Plasma Sci. Plasma Science, IEEE Transactions on. 52(5):1669-1675 May, 2024

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