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1مؤتمر
المؤلفون: M, Arangarajan, Yadav, Amar Pal, Veena, Ch, C, Sasthi Kumar, Patel, Gaurang A., Sahu, Dillip Narayan
المصدر: 2024 IEEE International Conference on Big Data & Machine Learning (ICBDML) Big Data & Machine Learning (ICBDML), 2024 IEEE International Conference on. :50-55 Feb, 2024
Relation: 2024 IEEE International Conference on Big Data & Machine Learning (ICBDML)
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2دورية أكاديمية
المؤلفون: Ghafoor, I., Tse, P.W., Chan, T.T., Hu, H.
المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-13 2024
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3مؤتمر
المؤلفون: Li, Jicheng, Xu, Jinkai, Chen, Guangjun, Zhou, Fei, Fu, Kaiming
المصدر: 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2023 IEEE International Conference on. :228-232 Jul, 2023
Relation: 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
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4مؤتمر
المؤلفون: Del Prete, Giuseppe, Leone, Fabrizio, Dentico, Valerio, Gallo, Nicola, Maio, Leandro, Memmolo, Vittorio, Vespini, Veronica, Coppola, Sara, Stella, Ettore, Ferraro, Pietro
المصدر: 2023 IEEE 10th International Workshop on Metrology for AeroSpace (MetroAeroSpace) Metrology for AeroSpace (MetroAeroSpace), 2023 IEEE 10th International Workshop on. :525-528 Jun, 2023
Relation: 2023 IEEE 10th International Workshop on Metrology for AeroSpace (MetroAeroSpace)
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5مؤتمر
المؤلفون: Zhang, Hui, Wang, Wanting, Xu, Lixin, Sun, Jing, Rui, Xiaobo, Yang, Xianhua
المصدر: 2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2023 IEEE International. :1-5 May, 2023
Relation: 2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
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6دورية أكاديمية
المؤلفون: Fan, ZongkaiAff1, Aff2, Aff3, Bai, KeranAff1, Aff2, Aff3, Chen, ChaoAff1, Aff2, Aff3, IDs0017002413569w_cor3
المصدر: The International Journal of Advanced Manufacturing Technology. 132(9-10):4135-4160
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7دورية أكاديمية
المؤلفون: Lin, YiqinAff1, Aff2, Aff3, Zou, DapengAff1, Aff3, IDs1254102400984y_cor2, Ye, Guoliang, Ji, Xuanrong, Zhang, YongkangAff1, Aff3, Aff5, Jiang, Xiaoming, Zhang, YanxiAff3, IDs1254102400984y_cor7
المصدر: International Journal of Precision Engineering and Manufacturing. 25(6):1209-1218
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8مؤتمر
المصدر: 2022 16th Symposium on Piezoelectricity, Acoustic Waves, and Device Applications (SPAWDA) Piezoelectricity, Acoustic Waves, and Device Applications (SPAWDA), 2022 16th Symposium on. :633-637 Oct, 2022
Relation: 2022 16th Symposium on Piezoelectricity, Acoustic Waves, and Device Applications (SPAWDA)
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9مؤتمر
المؤلفون: Wang, Wei, Xu, Yudong, Si, Wenrong, Pang, Xianhai, Cheng, Yinzhang, Li, Jianping, Yang, Dongdong, Chen, Yutong, Li, Long
المصدر: 2022 IEEE 6th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC ) Advanced Information Technology, Electronic and Automation Control Conference (IAEAC ), 2022 IEEE 6th. :727-730 Oct, 2022
Relation: 2022 IEEE 6th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC )
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10دورية أكاديمية
المؤلفون: Zhang, YanjieAff1, Aff2, Aff3, Li, Tianyou, Xu, Zhihui, Jiang, Ruipeng, Liu, YaxingAff1, Aff2, Aff3, IDS1061830924600047_cor5, Wang, Wei, Shi, Wei, Song, Yunfeng
المصدر: Russian Journal of Nondestructive Testing. 60(4):403-414