المؤلفون: M, Arangarajan, Yadav, Amar Pal, Veena, Ch, C, Sasthi Kumar, Patel, Gaurang A., Sahu, Dillip Narayan

المصدر: 2024 IEEE International Conference on Big Data & Machine Learning (ICBDML) Big Data & Machine Learning (ICBDML), 2024 IEEE International Conference on. :50-55 Feb, 2024

Relation: 2024 IEEE International Conference on Big Data & Machine Learning (ICBDML)

المؤلفون: Ghafoor, I., Tse, P.W., Chan, T.T., Hu, H.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-13 2024

المؤلفون: Li, Jicheng, Xu, Jinkai, Chen, Guangjun, Zhou, Fei, Fu, Kaiming

المصدر: 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2023 IEEE International Conference on. :228-232 Jul, 2023

Relation: 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

المؤلفون: Del Prete, Giuseppe, Leone, Fabrizio, Dentico, Valerio, Gallo, Nicola, Maio, Leandro, Memmolo, Vittorio, Vespini, Veronica, Coppola, Sara, Stella, Ettore, Ferraro, Pietro

المصدر: 2023 IEEE 10th International Workshop on Metrology for AeroSpace (MetroAeroSpace) Metrology for AeroSpace (MetroAeroSpace), 2023 IEEE 10th International Workshop on. :525-528 Jun, 2023

Relation: 2023 IEEE 10th International Workshop on Metrology for AeroSpace (MetroAeroSpace)

المؤلفون: Zhang, Hui, Wang, Wanting, Xu, Lixin, Sun, Jing, Rui, Xiaobo, Yang, Xianhua

المصدر: 2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2023 IEEE International. :1-5 May, 2023

Relation: 2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

المؤلفون: Fan, Zongkai^{Aff1, Aff2, Aff3}, Bai, Keran^{Aff1, Aff2, Aff3}, Chen, Chao^{Aff1, Aff2, Aff3, IDs0017002413569w_cor3}

المصدر: The International Journal of Advanced Manufacturing Technology. 132(9-10):4135-4160

المؤلفون: Lin, Yiqin^{Aff1, Aff2, Aff3}, Zou, Dapeng^{Aff1, Aff3, IDs1254102400984y_cor2}, Ye, Guoliang, Ji, Xuanrong, Zhang, Yongkang^{Aff1, Aff3, Aff5}, Jiang, Xiaoming, Zhang, Yanxi^{Aff3, IDs1254102400984y_cor7}

المصدر: International Journal of Precision Engineering and Manufacturing. 25(6):1209-1218

المؤلفون: Deng, Sen, Zhao, Bo

المصدر: 2022 16th Symposium on Piezoelectricity, Acoustic Waves, and Device Applications (SPAWDA) Piezoelectricity, Acoustic Waves, and Device Applications (SPAWDA), 2022 16th Symposium on. :633-637 Oct, 2022

Relation: 2022 16th Symposium on Piezoelectricity, Acoustic Waves, and Device Applications (SPAWDA)

المؤلفون: Wang, Wei, Xu, Yudong, Si, Wenrong, Pang, Xianhai, Cheng, Yinzhang, Li, Jianping, Yang, Dongdong, Chen, Yutong, Li, Long

المصدر: 2022 IEEE 6th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC ) Advanced Information Technology, Electronic and Automation Control Conference (IAEAC ), 2022 IEEE 6th. :727-730 Oct, 2022

Relation: 2022 IEEE 6th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC )

المؤلفون: Zhang, Yanjie^{Aff1, Aff2, Aff3}, Li, Tianyou, Xu, Zhihui, Jiang, Ruipeng, Liu, Yaxing^{Aff1, Aff2, Aff3, IDS1061830924600047_cor5}, Wang, Wei, Shi, Wei, Song, Yunfeng

المصدر: Russian Journal of Nondestructive Testing. 60(4):403-414