المؤلفون: Hwang, S., Overmeyer, J.D., Yousuf, S.M.E.H., Carr, W.N., Feng, P.X., Yoon, Y.

المصدر: IEEE Photonics Technology Letters IEEE Photon. Technol. Lett. Photonics Technology Letters, IEEE. 36(5):325-328 Mar, 2024

المؤلفون: Hwang, Sunghyun, Overmeyer, James D., Yousuf, S M Enamul Hoque, Carr, William N., Feng, Philip X.-L., Yoon, Yong-Kyu

المصدر: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2023 IEEE 73rd. :2150-2153 May, 2023

Relation: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)

المؤلفون: Tang, Meihui, Su, Lin, Zhao, Zhimeng, Wu, Siyu, Li, Pengfei, Zhao, Xiaofeng, Zhou, Fei, Li, Yuxiang, Wang, Shanlin^{Aff1, IDs11998024009254_cor9}

المصدر: Journal of Coatings Technology and Research. :1-12

المؤلفون: Wang, Z., Yi, Z., Qin, M., Huang, Q., Zhou, Z.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-9 2023

المؤلفون: Li, Mingyang, Min, Ruonan, Chen, Rongchun, Cao, Xinghao, Kang, Huijun^{Aff1, Aff2, IDs11664023107467_cor5}, Guo, Enyu^{Aff1, Aff2}, Chen, Zongning^{Aff1, Aff2}, Yang, Xiong, Wang, Tongmin^{Aff1, Aff2, IDs11664023107467_cor9}

المصدر: Journal of Electronic Materials. 53(1):171-176

المؤلفون: Gnanasekaran, Arulmurugan, Rajaram, Kamatchi^{Aff1, IDs11356023309957_cor2}

المصدر: Environmental Science and Pollution Research. 30(58):121807-121822

المؤلفون: Warren, Mitchell, Norley, Julian, Allen, John, Taylor, Jonathan, Keen, Lindsey

المصدر: 2021 37th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2021 37th. :1-9 Mar, 2021

Relation: 2021 37th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)

المؤلفون: Jie Zhu, Xuanhui Fan, Kewen Zhang, Jing Zhou, Dawei Tang

المصدر: Materials Research Letters, Vol 12, Iss 2, Pp 140-147 (2024)

مصطلحات موضوعية: SnTe nano-film, Zn dopant, thermoelectric, low thermal conductivity, time-domain thermoreflectance method, Materials of engineering and construction. Mechanics of materials, TA401-492

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2166-3831

URL الوصول: https://doaj.org/article/9ba14e3d794f49429653ff807083cd56

المؤلفون: Warren, Mitchell, Norley, Julian, Allen, John, Taylor, Jonathan, Keen, Lindsey

المصدر: 2020 36th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2020 36th. :82-90 Mar, 2020

Relation: 2020 36th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)

المؤلفون: Ning Wang, Siyu Gan, Guiling He, Qinqin Wei, Yupin Ji, Shijian Wang, Xihao Chen, Guangzhao Wang, Zhehao Sun, Jia Fu

المصدر: Results in Physics, Vol 56, Iss , Pp 107309- (2024)

مصطلحات موضوعية: Tl3XSe4, Ultra-low thermal conductivity, Pressure regulation, Thermal transport, First-principles calculations, Physics, QC1-999

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2211379723011026; https://doaj.org/toc/2211-3797

URL الوصول: https://doaj.org/article/2c26cf9ff8be4a58971755e674340e8d