-
1دورية أكاديمية
المؤلفون: Waldhoer, D., Schleich, C., Michl, J., Stampfer, B., Tselios, K., Ioannidis, E.G., Enichlmair, H., Waltl, M., Grasser, T.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(8):4057-4063 Aug, 2021
-
2دورية أكاديمية
المؤلفون: Parihar, N., Goel, N., Mukhopadhyay, S., Mahapatra, S.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(2):392-403 Feb, 2018
-
3دورية أكاديمية
المؤلفون: Mukhopadhyay, S., Parihar, N., Goel, N., Mahapatra, S.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(4):1474-1481 Apr, 2017
-
4دورية أكاديمية
المؤلفون: Mukhopadhyay, S., Goel, N., Mahapatra, S.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 63(10):4038-4045 Oct, 2016
-
5دورية أكاديمية
المؤلفون: Deora, S., Narayanasetti, P., Thakkar, M., Mahapatra, S.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 58(10):3506-3513 Oct, 2011
-
6دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
7
المؤلفون: Souvik Mahapatra, Nilesh Goel, Subhadeep Mukhopadhyay
المصدر: IEEE Transactions on Electron Devices. 63:4038-4045
مصطلحات موضوعية: Process Dependence, Relaxation, Materials science, Analytical chemistry, Physical-Mechanism, 02 engineering and technology, 01 natural sciences, Temperature measurement, High-K Metal Gate (Hkmg), Stress (mechanics), 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, Metal gate, Bias Temperature Instability, 010302 applied physics, I-Dlin Technique, Negative-bias temperature instability, Trap Generation (Tg), Condensed matter physics, Interface-Trap Generation, 020208 electrical & electronic engineering, Direct current, Negative Bias Temperature Instability (Nbti), Hkmg P-Mosfets, Reliability, Dc, Positive Bias Temperature Instability (Pbti), Electronic, Optical and Magnetic Materials, Delta-v (physics), Threshold voltage, Charge Trapping, Duty cycle, Direct Current Iv (Dciv), Ultrafast Measure Stress Measure (Uf-Msm), Gate Stacks
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::604b3669f8cd4e7d94eae0221b15f557
https://doi.org/10.1109/ted.2016.2599854
-
8دورية أكاديمية
المؤلفون: Nygaard, I., Holcomb, R.
المصدر: International Urogynecology Journal: Including Pelvic Floor Dysfunction. 01 2000 11(1):15-17
-
9
المؤلفون: Heidig, Katrin
المساهمون: Kaufmann, Otto, Geidel, Steffi
مصطلحات موضوعية: 39 Landwirtschaft, Garten, Stressmessung, disturbed milk ejection, measure stress, dairy cow, ZD 32110, heifers, Stress, Oxytocin, first milkings, environmental stress, Einmelken, Kalbung, milking, MES, 630 Landwirtschaft, Veterinärmedizin, Melken, ddc:630, Milchejektion, Milchejektionsstörung, Milchrind, calving, Färsen, Haltungsstress, milk ejection
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=od_______133::e60034dd85b5392e84ad998e177b39d7
http://edoc.hu-berlin.de/18452/16308 -
10مورد إلكتروني
مصطلحات الفهرس: Stress, Milchejektion, Milchejektionsstörung, MES, Melken, Einmelken, Oxytocin, Milchrind, Färsen, Haltungsstress, Stressmessung, Kalbung, stress, milk ejection, disturbed milk ejection, milking, first milkings, oxytocin, dairy cow, heifers, environmental stress, measure stress, calving, 630 Landwirtschaft und verwandte Bereiche, 39 Landwirtschaft, Garten, ZD 32110, ddc:630, doctoralThesis, doc-type:doctoralThesis
Full Text Finder 
Find this article in full text from Springer Verlag.