المؤلفون: Alanazi, Meznah M., Ali, Mahmood, Syed, Ikram, Henaish, A. M. A.^{Aff4, Aff5}, Ahmad, Zubair, Farid, Hafiz Muhammad Tahir^{Aff7, IDs11664024110580_cor6}

المصدر: Journal of Electronic Materials. 53(7):4039-4048

المؤلفون: Rui Peng, Muhammad Asadullah Khan, Can Li Liu

المصدر: Results in Chemistry, Vol 6, Iss , Pp 101218- (2023)

مصطلحات موضوعية: Dielectric spectroscopy, Microemulsion method, Nanoparticle synthesis, Dielectric relaxation, Interfacial polarization, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2211715623004575; https://doaj.org/toc/2211-7156

URL الوصول: https://doaj.org/article/c0f7f129cb8f4b63b87179d27e2767dd

المؤلفون: Liang, Dong^{Aff1, Aff2}, Xiong, Sang^{Aff2, Aff3, IDs12034023029173_cor2}, Zhang, Xiaomeng^{Aff1, Aff2}, Ye, Yuanfeng, Cao, Jingxin, Hu, Xingxing, Song, Yao, Wei, Qianwen

المصدر: Bulletin of Materials Science: Published by the Indian Academy of Sciences. 46(2)

المؤلفون: Chang, Hyejin^Aff8, Kim, Jaehi^Aff9, Rho, Won-Yeop^Aff10, Pham, Xuan-Hung^Aff9, Lee, Jong Hun^Aff11, Lee, Sang Hun^Aff12, Jeong, Dae Hong^Aff13, Jun, Bong-Hyun^Aff9

المساهمون: Crusio, Wim E., Series Editor^Aff1, Dong, Haidong, Series Editor^Aff2, Radeke, Heinfried H., Series Editor^Aff3, Rezaei, Nima, Series Editor^Aff4, Steinlein, Ortrud, Series Editor^Aff5, Xiao, Junjie, Series Editor^Aff6, Jun, Bong-Hyun, editor^Aff7

المصدر: Nanotechnology for Bioapplications. 1309:41-65

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المؤلفون: Liu, Wenwen, Chang, Ziling, Yao, Pingping, Huang, Yan, Liu, Xiangnong, Yang, Yuxiang^{Aff1, IDS1087659621060183_cor6}, Carlini, Riccardo^{Aff3, IDS1087659621060183_cor7}

المصدر: Glass Physics and Chemistry. 47(6):590-600

المؤلفون: Shuangshuang Liu, Jingde Zhang, Yuhang Tian, Jian Sun, Panxin Huang, Jianzhang Li, Guifang Han

المصدر: Materials, Vol 16, Iss 13, p 4673 (2023)

مصطلحات موضوعية: microemulsion method, yttrium-stabilized zirconia (YSZ), yttrium-stabilized bismuth oxide (YSB), electrolyte, oxygen vacancy, SOFC, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1996-1944/16/13/4673; https://doaj.org/toc/1996-1944

URL الوصول: https://doaj.org/article/2933646c1e9a4fabb58b256768a5fcb9

المؤلفون: Rondan, W.^{Aff1, Aff2}, Rivera, M., Acosta, D., Puga, R., Loro, H., Eyzaguirre, C., Champi, A.^{Aff2, IDs13538022010975_cor7}

المصدر: Brazilian Journal of Physics. 52(3)

المؤلفون: Qiao, Senrong, Li, Huijun, Cheng, Xiaoqin, Bian, Dongyu, Wang, Xiaomin^{Aff1, IDs1170602206059_cor5}

المصدر: Frontiers of Materials Science. 16(2)