المؤلفون: Chudilin, Oleg, Fedoseev, Victor

المصدر: 2024 X International Conference on Information Technology and Nanotechnology (ITNT) Information Technology and Nanotechnology (ITNT), 2024 X International Conference on. :1-5 May, 2024

Relation: 2024 X International Conference on Information Technology and Nanotechnology (ITNT)

المؤلفون: Ling, Y., Qiu, A., Wan, L., Wang, F., Zhu, K., Zhang, Y., Xie, Q.

المصدر: IEEE Transactions on Radiation and Plasma Medical Sciences IEEE Trans. Radiat. Plasma Med. Sci. Radiation and Plasma Medical Sciences, IEEE Transactions on. 8(3):248-256 Mar, 2024

المؤلفون: Zhou, F., D'Ascenzo, N., Zhang, B., Antonecchia, E., Fang, L., Ba, L., Zhang, M., Zhu, X., Liu, Q., Ni, J., Frati, G., Kreissl, M., Chen, X., Wu, J., Xie, Q.

المصدر: IEEE Transactions on Radiation and Plasma Medical Sciences IEEE Trans. Radiat. Plasma Med. Sci. Radiation and Plasma Medical Sciences, IEEE Transactions on. 8(3):287-294 Mar, 2024

المؤلفون: Antonecchia, E., D'Ascenzo, N., Cantalamessa, S., Chang, W., Ciardiello, M., Kattan, M., Nematpour, A., Pagnani, G., Palazzo, F., Punzet, D., Shen, G., Zhou, F., Pisante, M., Xie, Q.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(1):113-120 Jan, 2024

المؤلفون: Tirado-Serrato, J.G.

المصدر: IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 13(5):750-755 Sep, 2023

المؤلفون: Li, M., Zhai, D., Yang, D., Xu, L.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(11):11815-11824 Jun, 2023

المؤلفون: Qiu, A., Wan, L., Ling, Y., Xie, Q.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(5):847-852 May, 2023

المؤلفون: Semar-Bitah, Kahina, Mouzai, Meriem, Kherchi, Asma Manel, Milla, Toufik, Bougrid, Dalila, Bourahla, Hakima

المصدر: 2022 4th International Conference on Pattern Analysis and Intelligent Systems (PAIS) Pattern Analysis and Intelligent Systems (PAIS), 2022 4th International Conference on. :1-7 Oct, 2022

Relation: 2022 4th International Conference on Pattern Analysis and Intelligent Systems (PAIS)

المؤلفون: Liu, H., Lin, C., Gong, B.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-12 2023

المؤلفون: Kumar, T. Saran^Aff18, Rao, I. Rama Satya Nageswara^Aff18, Vinod, Y. Satya^Aff18, Harika, P.^Aff18, Satyanarayana, B. V. V.^Aff19, Pravin, A.^Aff18

المساهمون: Akan, Ozgur, Editorial Board Member^Aff1, Bellavista, Paolo, Editorial Board Member^Aff2, Cao, Jiannong, Editorial Board Member^Aff3, Coulson, Geoffrey, Editorial Board Member^Aff4, Dressler, Falko, Editorial Board Member^Aff5, Ferrari, Domenico, Editorial Board Member^Aff6, Gerla, Mario, Editorial Board Member^Aff7, Kobayashi, Hisashi, Editorial Board Member^Aff8, Palazzo, Sergio, Editorial Board Member^Aff9, Sahni, Sartaj, Editorial Board Member^Aff10, Shen, Xuemin, Editorial Board Member^Aff11, Stan, Mircea, Editorial Board Member^Aff12, Jia, Xiaohua, Editorial Board Member^Aff13, Zomaya, Albert Y., Editorial Board Member^Aff14, Pareek, Prakash, editor^Aff15, Gupta, Nishu, editor^Aff16, Reis, M. J. C. S., editor^Aff17

المصدر: Cognitive Computing and Cyber Physical Systems : 4th EAI International Conference, IC4S 2023, Bhimavaram, Andhra Pradesh, India, August 4-6, 2023, Proceedings, Part II. 537:63-75