-
1دورية أكاديمية
المؤلفون: Stan, CV, O’bannon, EF, Mukhin, P, Tamura, N, Dobrzhinetskaya, L
المصدر: Minerals. 10(3)
مصطلحات موضوعية: SiC, Laue diffraction, microdiffraction, natural silicon, moissanite, Si, synchrotron, polymorph, mineral deformation, Geology, Environmental Science and Management, Resources Engineering and Extractive Metallurgy
وصف الملف: application/pdf
URL الوصول: https://escholarship.org/uc/item/58b7608p
-
2دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
3دورية أكاديمية
المؤلفون: Tetel’baum, D. I.Aff1, cor1, Tulovchikov, V. S., Mendeleva, Yu. A., Kuril’chik, E. V., Nikolskaya, A. A., Stepanov, A. V.
المصدر: Technical Physics. 64(9):1350-1356
-
4دورية أكاديمية
المؤلفون: Camelia Veronica Stan, Earl Francis O’Bannon, Pavel Mukhin, Nobumichi Tamura, Larissa Dobrzhinetskaya
المصدر: Minerals, Vol 10, Iss 3, p 204 (2020)
مصطلحات موضوعية: sic, laue diffraction, microdiffraction, natural silicon, moissanite, si, synchrotron, polymorph, mineral deformation, Mineralogy, QE351-399.2
وصف الملف: electronic resource
-
5
-
6
المؤلفون: E. F. O'Bannon, Larissa F. Dobrzhinetskaya, Pavel Mukhin, Nobumichi Tamura, Camelia V. Stan
المصدر: Minerals
Volume 10
Issue 3
Minerals, vol 10, iss 3
Minerals, Vol 10, Iss 3, p 204 (2020)مصطلحات موضوعية: SiC, Materials science, lcsh:QE351-399.2, 010504 meteorology & atmospheric sciences, Silicon, Environmental Science and Management, polymorph, Analytical chemistry, Resources Engineering and Extractive Metallurgy, chemistry.chemical_element, engineering.material, 010502 geochemistry & geophysics, 01 natural sciences, law.invention, Crystal, symbols.namesake, natural silicon, law, synchrotron, Moissanite, 0105 earth and related environmental sciences, Laue diffraction, lcsh:Mineralogy, Geology, Geotechnical Engineering and Engineering Geology, Synchrotron, chemistry, moissanite, microdiffraction, X-ray crystallography, engineering, symbols, Crystallite, Si, Dislocation, Raman spectroscopy, mineral deformation
وصف الملف: application/pdf
-
7
المؤلفون: Jean-Luc Autran, Daniela Munteanu
المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)
المصدر: Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2021
Microelectronics Reliability, 2021, ⟨10.1016/j.microrel.2021.114223⟩مصطلحات موضوعية: Materials science, Silicon, Nuclear engineering, Geant4, chemistry.chemical_element, 02 engineering and technology, soft-error rate, 01 natural sciences, 7. Clean energy, natural silicon, Reliability (semiconductor), single event upset, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, neutron interactions, Nuclear fusion, Neutron, Electronics, D-T neutron, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Electrical and Electronic Engineering, Nuclear Experiment, Safety, Risk, Reliability and Quality, 010302 applied physics, Range (particle radiation), ENDF/B-VII.1, 020208 electrical & electronic engineering, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, D-D neutron, silicon isotopes, chemistry, SRIM, Single event upset, Nuclear cross section, MCNP6
-
8دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
9تقرير
المساهمون: Jones, P.
وصف الملف: Medium: ED; Size: 5 p.
-
10دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.