-
1
المؤلفون: null Hurkx, null Peek, null Slotboom, null Windgassen
المصدر: International Technical Digest on Electron Devices Meeting.
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, Condensed matter physics, Dopant, business.industry, Doping, Hardware_PERFORMANCEANDRELIABILITY, Gate voltage, Hardware_INTEGRATEDCIRCUITS, Electron hole recombination, Optoelectronics, business, Quantum tunnelling, Hardware_LOGICDESIGN, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1db3c531c9a9942c2afa913d7867466f
https://doi.org/10.1109/iedm.1992.307506 -
2
المؤلفون: null Bakker, null van Kuijk, null O'Dwyer, null Bisschop, null Peek, null Stekelenburg
المصدر: IEEE International Conference on Consumer Electronics.
مصطلحات موضوعية: business.industry, Computer science, Transfer (computing), Frame (networking), High resolution, Computer vision, Artificial intelligence, Image sensor, business, Image resolution, Image sensor format
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::95f141a70f2b6ce767338bce86fd8b96
https://doi.org/10.1109/icce.1990.665959 -
3
المؤلفون: null Chu, C.K., null Hong, J.H., null Choi, Y., null Du, J., null Lee, K., null Chun, B.K., null Boudinot, D.F., null Peek, S.F., null Korba, B.E., null Tennant, B.C., null Cheng, Y.-C.
المصدر: Drugs of the Future. 23:0821
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f1bd8c4c000de91357b555a73e8887d6
https://doi.org/10.1358/dof.1998.023.08.467649 -
4
المؤلفون: null Peek
المصدر: Real Analysis Exchange. 19:39
مصطلحات موضوعية: Geometry and Topology, Analysis
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b11dd731c4ef13e3ed9646f915ed8bd8
https://doi.org/10.2307/44153801 -
5
المؤلفون: null Peek
المصدر: Real Analysis Exchange. 17:751
مصطلحات موضوعية: Geometry and Topology, Analysis
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::40a3e44fe516463b8ecc36ace2d84045
https://doi.org/10.2307/44153767 -
6
المؤلفون: null Starr, null Lloyd, null Peek
المصدر: Journal of the A.I.E.E.. 46:1457-1461
مصطلحات موضوعية: Corona (optical phenomenon), Materials science, Dielectric strength, Peek's law, Composite material
-
7
المؤلفون: T. E. R. Phillips, MM. Andrea, null Antoniadi, null Armellini, null Baldet, null Bobrovnikoff, L. Campbell, null Delporte, null Doniteli, null Dunham, null Gastardi, Mile Harwood, MM. Jarry-Desloges, null Lampland, null Luplau-Janssen, null Lyot, null Maggini, null Nicholson, null Peek, W. U. Pickering, null Plakidis, null Quénisset, null Ross, E. C. Slipher, V. M. Slipher, null Stroobant, null Wildt, F. E. Wright, W. H. Wright
المصدر: Transactions of the International Astronomical Union. 5:96-107
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dba955bc110d14c7db350270334375a5
https://doi.org/10.1017/s0251107x00017193 -
8
المؤلفون: M. M. Maggini, M.M. Andrea, null Antoniadi, null Armellini, L. Campbell, null Delporte, null Dunham, null Hargreaves, Mlle Harwood, MM. Jarry-Desloges, null Lampland, null Link, null Luplau-Janssen, null Lyot, null Nicholson, null Peek, null Phillips, null Plakidis, null Quénisset, F. E. Ross, E. C. Slipher, null Wildt, F. E. Wright, W. H. Wright
المصدر: Transactions of the International Astronomical Union. 6:114-119
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ac9d3a7c4661cff9f16050bbd8ccc5a7
https://doi.org/10.1017/s0251107x00018010 -
9
المؤلفون: null Hull, null Whitehead, null Peek, null McEachron
المصدر: Journal of the American Institute of Electrical Engineers. 42:1357-1362
مصطلحات موضوعية: Materials science, business.industry, Ionization, Cavity magnetron, Electrical engineering, High voltage, Transient (oscillation), Mechanics, Dielectric, business, Lightning, Corona, Voltage
-
10
المؤلفون: null Peek
المصدر: Real Analysis Exchange. 13:67
مصطلحات موضوعية: Geometry and Topology, Analysis
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a5a4a02f38b3fbf7a8d538fa272bd0f3
https://doi.org/10.2307/44151847