المؤلفون: Guo, J., Liang, J., Li, Y., Li, J., Li, Z.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(8):4732-4739 Aug, 2024

المؤلفون: Sun, Huifen

المصدر: 2023 IEEE 2nd International Conference on Electrical Engineering, Big Data and Algorithms (EEBDA) Electrical Engineering, Big Data and Algorithms (EEBDA), 2023 IEEE 2nd International Conference on. :1704-1708 Feb, 2023

Relation: 2023 IEEE 2nd International Conference on Electrical Engineering, Big Data and Algorithms (EEBDA)

المؤلفون: Xiangdong Yu, Sohyun Park, Sungwoon Lee, Sang-Woo Joo, Jaebum Choo

المصدر: Nano Convergence, Vol 11, Iss 1, Pp 1-14 (2024)

مصطلحات موضوعية: Surface-enhanced Raman scattering, Microfluidics, Lab-on-a-chip, On-chip detection, Biomedical diagnostics, Technology, Chemical technology, TP1-1185, Biotechnology, TP248.13-248.65, Science, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2196-5404

URL الوصول: https://doaj.org/article/c71675f841624b27851e9c1944f55889

المؤلفون: Liu, W., Yang, X., Gao, H.

المصدر: IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 69(5):5247-5256 May, 2022

المؤلفون: Alam, Badrul, Buzzin, Alessio, Grossi, Francesca, Caputo, Domenico, Cesare, Giampiero de, Asquini, Rita

المصدر: 2022 IEEE Photonics Conference (IPC) Photonics Conference (IPC), 2022 IEEE. :1-2 Nov, 2022

Relation: 2022 IEEE Photonics Conference (IPC)

المؤلفون: Ma, H., He, J., Liu, Y., Kuai, J., Li, H., Liu, L., Zhao, Y.

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 40(10):1985-1994 Oct, 2021

المؤلفون: Stellari, Franco, Wang, Naigang, Song, Peilin

المصدر: 2018 48th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2018 48th European. :250-253 Sep, 2018

Relation: ESSDERC 2018 - 48th European Solid-State Device Research Conference (ESSDERC)

المؤلفون: Tehranipoor, Mark^Aff4, Nalla Anandakumar, N.^Aff5, Farahmandi, Farimah^Aff4

المساهمون: Tehranipoor, Mark^Aff1, Anandakumar, N. Nalla^Aff2, Farahmandi, Farimah^Aff3

المصدر: Hardware Security Training, Hands-on!. :35-52

المؤلفون: Qiao, Xindan^{Aff14, Aff15}, Chen, Ting^{Aff14, Aff15}, Zhuang, Wanjing^{Aff14, Aff15}, Wu, Jinyi^{Aff14, Aff15}

المساهمون: Ceccarelli, Marco, Series Editor^Aff1, Agrawal, Sunil K., Advisory Editor^Aff2, Corves, Burkhard, Advisory Editor^Aff3, Glazunov, Victor, Advisory Editor^Aff4, Hernández, Alfonso, Advisory Editor^Aff5, Huang, Tian, Advisory Editor^Aff6, Jauregui Correa, Juan Carlos, Advisory Editor^Aff7, Takeda, Yukio, Advisory Editor^Aff8, Zhang, Hao, editor^Aff9, Feng, Guojin, editor^Aff10, Wang, Hongjun, editor^Aff11, Gu, Fengshou, editor^Aff12, Sinha, Jyoti K., editor^Aff13

المصدر: Proceedings of IncoME-VI and TEPEN 2021 : Performance Engineering and Maintenance Engineering. 117:555-568

المؤلفون: Xu, Chao, Bai, Lifei, Zhang, Zhihao, Han, Boxuan

المصدر: IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society Industrial Electronics Society , IECON 2017 - 43rd Annual Conference of the IEEE. :6855-6858 Oct, 2017

Relation: IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society