يعرض 1 - 10 نتائج من 86 نتيجة بحث عن '"on chip monitoring"', وقت الاستعلام: 1.05s تنقيح النتائج
  1. 1
    مؤتمر
    On-Chip Monitoring of Time-Dependent Dielectric Breakdown (TDDB) using a Novel Leakage Current Sensor with Digital Output

    المؤلفون: Darko, Emmanuel Nti, Bhatheja, Kushagra, Adjei, Daniel, Strong, Matthew, Chen, Degang

    المصدر: 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-6 Oct, 2023

    Relation: 2023 IEEE International Integrated Reliability Workshop (IIRW)

    Full Text Finder
    أضف إلى المفضلة
  2. 2
    دورية أكاديمية
    In-Place Evaluation of Powering and Signaling Within Fan-Out Multiple IC Chip Packaging

    المؤلفون: Sonoda, H., Kasai, R., Tanaka, D., Murakami, Y., Mihara, K., Araga, Y., Watanabe, N., Shimamoto, H., Kikuchi, K., Miki, T., Nagata, M.

    المصدر: IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 12(7):1140-1149 Jul, 2022

    Full Text Finder
    أضف إلى المفضلة
  3. 3
    دورية أكاديمية
    Physical Attack Protection Techniques for IC Chip Level Hardware Security

    المؤلفون: Nagata, M., Miki, T., Miura, N.

    المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 30(1):5-14 Jan, 2022

    Full Text Finder
    أضف إلى المفضلة
  4. 4
    مؤتمر
    Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring

    المؤلفون: Monta, Kazuki, Kataselas, Leonidas, Fodor, Ferenc, Hatzopoulos, Alkis, Nagata, Makoto, Marinissen, Erik Jan

    المصدر: 2021 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2021 IEEE European. :1-4 May, 2021

    Relation: 2021 IEEE European Test Symposium (ETS)

    Full Text Finder
    أضف إلى المفضلة
  5. 5
    مؤتمر
    A novel approach to in-field, in-mission reliability monitoring based on Deep Data

    المؤلفون: Landman, Evelyn, Brousard, Noam, Naishlos, Tamar

    المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-8 Apr, 2020

    Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

    Full Text Finder
    أضف إلى المفضلة
  6. 6
    دورية أكاديمية
    3-D CMOS Chip Stacking for Security ICs Featuring Backside Buried Metal Power Delivery Networks With Distributed Capacitance

    المؤلفون: Monta, K., Sonoda, H., Okidono, T., Araga, Y., Watanabe, N., Shimamoto, H., Kikuchi, K., Miura, N., Miki, T., Nagata, M.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(4):2077-2082 Apr, 2021

    Full Text Finder
    أضف إلى المفضلة
  7. 7
    دورية أكاديمية
    On-Chip Thermal Profiling to Detect Malicious Activity: System-Level Concepts and Design of Key Building Blocks

    المؤلفون: Yan, M., Wei, H., Onabajo, M.

    المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 29(3):530-543 Mar, 2021

    Full Text Finder
    أضف إلى المفضلة
  8. 8
    مؤتمر
    An ESL Methodology for HW/SW Co-Design of Monitorable Embedded Systems: the “Design for Monitorability” Project - Work-in-Progress

    المؤلفون: Valente, Giacomo, Di Mascio, Tania, Pomante, Luigi, Stoico, Vincenzo

    المصدر: 2020 International Conference on Hardware/Software Codesign and System Synthesis (CODES+ISSS) Hardware/Software Codesign and System Synthesis (CODES+ISSS), 2020 International Conference on. :40-42 Sep, 2020

    Relation: 2020 International Conference on Hardware/Software Codesign and System Synthesis (CODES+ISSS)

    أضف إلى المفضلة
  9. 9
    دورية أكاديمية
    On-Chip Impedance for Quantifying Parasitic Voltages During AC Electrokinetic Trapping

    المؤلفون: Farmehini, V., Varhue, W., Salahi, A., Hyler, A.R., Cemazar, J., Davalos, R.V., Swami, N.S.

    المصدر: IEEE Transactions on Biomedical Engineering IEEE Trans. Biomed. Eng. Biomedical Engineering, IEEE Transactions on. 67(6):1664-1671 Jun, 2020

    Full Text Finder
    أضف إلى المفضلة
  10. 10
    مؤتمر
    An efficient all-digital IR-Drop Alarmer for DVFS-based SoC

    المؤلفون: Yu, Liting, Wang, Xiaoxiao, Cheng, Yuanqing, Zhao, Xiaoying, Jiao, Pengyuan, Chen, Aixin, Su, Donglin, Winemberg, LeRoy, Sadi, Mehdi, Tehranipoor, Mark

    المصدر: 2016 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2016 IEEE International Symposium on. :221-224 May, 2016

    Relation: 2016 IEEE International Symposium on Circuits and Systems (ISCAS)

    Full Text Finder
    أضف إلى المفضلة
أدوات البحث: أحصل على تغذية RSS – أرسل هذا البحث بالبريد الإلكتروني – حفظ البحث – جدول التنبيهات: لا شيء