يعرض 1 - 10 نتائج من 372 نتيجة بحث عن '"process fault"', وقت الاستعلام: 0.89s تنقيح النتائج
  1. 1
    مؤتمر

    المؤلفون: Zhu, Yongye, Zhou, Jinglin

    المصدر: 2024 IEEE 13th Data Driven Control and Learning Systems Conference (DDCLS) Data Driven Control and Learning Systems Conference (DDCLS), 2024 IEEE 13th. :1900-1905 May, 2024

    Relation: 2024 IEEE 13th Data Driven Control and Learning Systems Conference (DDCLS)

  2. 2
    مؤتمر

    المؤلفون: Guerfel, Mohamed, Messaoud, Hassani

    المصدر: 2024 International Conference on Control, Automation and Diagnosis (ICCAD) Control, Automation and Diagnosis (ICCAD), 2024 International Conference on. :1-6 May, 2024

    Relation: 2024 International Conference on Control, Automation and Diagnosis (ICCAD)

  3. 3
    دورية أكاديمية

    المؤلفون: Xiao, Y., Shi, H., Song, B., Tao, Y., Tan, S., Wang, B.

    المصدر: IEEE Transactions on Industrial Informatics IEEE Trans. Ind. Inf. Industrial Informatics, IEEE Transactions on. 20(3):4773-4783 Mar, 2024

  4. 4
    دورية أكاديمية

    المؤلفون: Wang, L., Liu, J., Zhang, H., Zuo, F.

    المصدر: IEEE Transactions on Industrial Informatics IEEE Trans. Ind. Inf. Industrial Informatics, IEEE Transactions on. 20(2):2738-2750 Feb, 2024

  5. 5
    دورية أكاديمية

    المؤلفون: Li, S., Yu, J.

    المصدر: IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 70(6):6272-6283 Jun, 2023

  6. 6
    مؤتمر

    المصدر: 2022 China Automation Congress (CAC) Automation Congress (CAC), 2022 China. :6439-6444 Nov, 2022

    Relation: 2022 China Automation Congress (CAC)

  7. 7
    دورية أكاديمية

    المؤلفون: Xiao, Y., Shi, H., Wang, B., Tao, Y., Tan, S., Song, B.

    المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-12 2023

  8. 8
    دورية أكاديمية

    المؤلفون: Zheng, S., Zhao, J.

    المصدر: IEEE Transactions on Industrial Informatics IEEE Trans. Ind. Inf. Industrial Informatics, IEEE Transactions on. 18(10):6700-6711 Oct, 2022

  9. 9
    كتاب إلكتروني

    المؤلفون: Chen, HaoAff36, Feng, JianxunAff37, Jin, AilingAff38, Li, BolunAff39

    المساهمون: Angrisani, Leopoldo, Series EditorAff1, Arteaga, Marco, Series EditorAff2, Chakraborty, Samarjit, Series EditorAff3, Chen, Shanben, Series EditorAff4, Chen, Tan Kay, Series EditorAff5, Dillmann, Rüdiger, Series EditorAff6, Duan, Haibin, Series EditorAff7, Ferrari, Gianluigi, Series EditorAff8, Ferre, Manuel, Series EditorAff9, Hirche, Sandra, Series EditorAff10, Jabbari, Faryar, Series EditorAff11, Jia, Limin, Series EditorAff12, Kacprzyk, Janusz, Series EditorAff13, Khamis, Alaa, Series EditorAff14, Kroeger, Torsten, Series EditorAff15, Li, Yong, Series EditorAff16, Liang, Qilian, Series EditorAff17, Martín, Ferran, Series EditorAff18, Ming, Tan Cher, Series EditorAff19, Minker, Wolfgang, Series EditorAff20, Misra, Pradeep, Series EditorAff21, Mukhopadhyay, Subhas, Series EditorAff22, Ning, Cun-Zheng, Series EditorAff23, Nishida, Toyoaki, Series EditorAff24, Oneto, Luca, Series EditorAff25, Panigrahi, Bijaya Ketan, Series EditorAff26, Pascucci, Federica, Series EditorAff27, Qin, Yong, Series EditorAff28, Seng, Gan Woon, Series EditorAff29, Speidel, Joachim, Series EditorAff30, Veiga, Germano, Series EditorAff31, Wu, Haitao, Series EditorAff32, Zamboni, Walter, Series EditorAff33, Tan, Kay Chen, Series EditorAff34, Gaber, Hossam, editorAff35

    المصدر: Proceedings of The 6th International Conference on Clean Energy and Electrical Systems : Proceedings of CEES 2024. 1222:170-183

  10. 10
    دورية أكاديمية

    المؤلفون: Ren, Y., Liu, J., Zhang, H., Wang, J.

    المصدر: IEEE Transactions on Industrial Informatics IEEE Trans. Ind. Inf. Industrial Informatics, IEEE Transactions on. 18(9):6109-6119 Sep, 2022