-
1مؤتمر
المؤلفون: Noyan, Utku, Lu, Sheung, Al-Shabili, Abdullah, Dandin, Marc, Chan, Stanley H., Abshire, Pamela
المصدر: 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS) Circuits and Systems (MWSCAS), 2023 IEEE 66th International Midwest Symposium on. :875-879 Aug, 2023
Relation: 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS)
-
2مؤتمر
المؤلفون: Pongrac, Blaz, Sarjas, Andrej, Gleich, Dusan
المصدر: 2022 29th International Conference on Systems, Signals and Image Processing (IWSSIP) Systems, Signals and Image Processing (IWSSIP), 2022 29th International Conference on. CFP2255E-ART:1-4 Jun, 2022
Relation: 2022 29th International Conference on Systems, Signals and Image Processing (IWSSIP)
-
3كتاب إلكتروني
المؤلفون: Gupta, MohitAff2
المساهمون: Liang, Jinyang, editorAff1
المصدر: Coded Optical Imaging. :307-321
-
4مؤتمرGeneralization of the Multipath Interference Compensation Algorithm in Pulsed Time-of-Flight Imaging
المؤلفون: Liu, Chuan, Lang, Shinan, Wu, Qiang, Zhang, Jizhong
المصدر: 2019 IEEE Symposium on Product Compliance Engineering - Asia (ISPCE-CN) Product Compliance Engineering - Asia (ISPCE-CN), 2019 IEEE Symposium on. :1-5 Oct, 2019
Relation: 2019 IEEE Symposium on Product Compliance Engineering - Asia (ISPCE-CN)
-
5مؤتمر
المؤلفون: Zhang, Jizhong, Lang, Shinan, Wu, Qiang, Liu, Chuan
المصدر: 2019 IEEE Symposium on Product Compliance Engineering - Asia (ISPCE-CN) Product Compliance Engineering - Asia (ISPCE-CN), 2019 IEEE Symposium on. :1-8 Oct, 2019
Relation: 2019 IEEE Symposium on Product Compliance Engineering - Asia (ISPCE-CN)
-
6دورية أكاديمية
المؤلفون: Kurtti, S., Jansson, J., Kostamovaara, J.
المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 69(5):2208-2217 May, 2020
-
7مؤتمر
المؤلفون: Kurtti, S., Nissinen, J., Jansson, J.-P., Kostamovaara, J.
المصدر: 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2018 IEEE International. :1-5 May, 2018
Relation: 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC )
-
8مؤتمر
المصدر: 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2017 IEEE International. :1-6 May, 2017
Relation: 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
-
9مؤتمر
المؤلفون: Aikio, Janne P., Kostamovaara, Juha, Berg, Markus, Salonen, Erkki T.
المصدر: 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2017 IEEE International. :1-6 May, 2017
Relation: 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
-
10مؤتمر
المؤلفون: Jahromi, S., Jansson, J.-P., Kostamovaara, J.
المصدر: 2015 IEEE SENSORS SENSORS, 2015 IEEE. :1-4 Nov, 2015
Relation: 2015 IEEE SENSORS