يعرض 1 - 10 نتائج من 1,718 نتيجة بحث عن '"reverse bias"', وقت الاستعلام: 2.06s تنقيح النتائج
  1. 1
    مؤتمر
    The Reverse Bias Reliability of SiC MOSFET Under Different Conditions and Failure Analysis

    المؤلفون: Cai, Jinhao, Peng, Yongjie, Fan, Jianfeng, Fang, Shuanzhu, Wang, Hongyue, Wang, Zhizhe

    المصدر: 2024 25th International Conference on Electronic Packaging Technology (ICEPT) Electronic Packaging Technology (ICEPT), 2024 25th International Conference on. :1-5 Aug, 2024

    Relation: 2024 25th International Conference on Electronic Packaging Technology (ICEPT)

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  2. 2
    دورية أكاديمية
    Degradation Mechanism of Normally-On AlGaN/GaN HEMTs Under Short- and Long-Term HTRB Stress

    المؤلفون: Chen, Y., Lu, M., Liu, C., Liao, M.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(9):5258-5263 Sep, 2024

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  3. 3
    مؤتمر
    Dynamic Reverse Bias Test Circuit for SiC MOSFET with Adjustable dV ds/dt

    المؤلفون: Lu-Wei, Zuo, Hui, Meng, Ze, Zhou, Bin, Yu, Haoze, Luo, Zhen, Xin

    المصدر: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia), 2024 IEEE 10th International. :3688-3693 May, 2024

    Relation: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)

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  4. 4
    دورية أكاديمية
    Analysis of Effects of Defects on Degradation Mechanism of 1200-V/40-A 4H-SiC Junction Barrier Schottky Diodes Induced by High-Reserve Bias Stress

    المؤلفون: Li, J., Ding, T., Zhou, L., Wu, Z.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(5):2931-2935 May, 2024

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  5. 5
    مؤتمر
    Deep Investigation on SiC MOSFET Degradation under Gate Switching Stress and Application Switching Stress

    المؤلفون: Gomez, Alexis A., Garcia-Mere, Juan R., Rodriguez, Alberto, Rodriguez, Juan, Jimenez, Carlos, Roig-Guitart, Jaume

    المصدر: 2024 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2024 IEEE. :1067-1072 Feb, 2024

    Relation: 2024 IEEE Applied Power Electronics Conference and Exposition (APEC)

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  6. 6
    دورية أكاديمية
    Field Stack Lighting Driving Method for Low Power Organic Light Emitting Diode-on-Silicon Microdisplay

    المؤلفون: Mu, T., Ji, Y., Zhang, Y., Liu, X., Huang, X., Ran, F.

    المصدر: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 30(2: Integrated Optoelectronics for VR/AR/MR):1-11 Apr, 2024

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  7. 7
    مؤتمر
    Characterization and Early Qualification Activities on Si Planar Blocking Diodes

    المؤلفون: Ferrando, Emanuele, Albertin, Andrea, Tiedemann, Lars, Van Riesen, Sascha, Zrinscak, Ivica, Schneider, Jurgen

    المصدر: 2023 13th European Space Power Conference (ESPC) Space Power Conference (ESPC), 2023 13th European. :1-5 Oct, 2023

    Relation: 2023 13th European Space Power Conference (ESPC)

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  8. 8
    مؤتمر
    Study of the Causes of Degradation of Space III-V Multijunction Solar Cells at Reverse Bias Operation

    المؤلفون: Cano, Aitana, Garcia, Ivan, Martin, Pablo, Rey-Stolle, Ignacio

    المصدر: 2023 13th European Space Power Conference (ESPC) Space Power Conference (ESPC), 2023 13th European. :1-5 Oct, 2023

    Relation: 2023 13th European Space Power Conference (ESPC)

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  9. 9
    مؤتمر
    Fabrication of Ampere-Class $p$-Cu2O/$n-\beta$-Ga2O3 Trench Heterojunction Barrier Schottky Diodes and Double-Pulse Evaluation

    المؤلفون: Takatsuka, Akio, Miyamoto, Hironobu, Sasaki, Kohei, Kuramata, Akito

    المصدر: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2023 35th International Symposium on. :342-345 May, 2023

    Relation: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

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  10. 10
    مؤتمر
    OFF State Reliability Challenges of Monolayer WS2 FET Photodetector: Impact on the Dark and Photo-Illuminated State

    المؤلفون: Verma, Rupali, Patbhaje, Utpreksh, Kumar, Jeevesh, Rai, Anand Kumar, Shrivastava, Mayank

    المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023

    Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

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