يعرض 1 - 10 نتائج من 4,215 نتيجة بحث عن '"ring oscillators"', وقت الاستعلام: 1.46s تنقيح النتائج
  1. 1
    مؤتمر
    Detection of Stealthy Bitstreams in Cloud FPGAs using Graph Convolutional Networks*

    المؤلفون: Chaudhuri, Jayeeta, Chakrabarty, Krishnendu

    المصدر: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-6 May, 2024

    Relation: 2024 IEEE European Test Symposium (ETS)

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  2. 2
    مؤتمر
    Modeling Thermal Effects For Biasing PUFs

    المؤلفون: Douadi, Aghiles, Vatajelu, Elena-Ioana, Maistri, Paolo, Hely, David, Beroulle, Vincent, Di Natale, Giorgio

    المصدر: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-4 May, 2024

    Relation: 2024 IEEE European Test Symposium (ETS)

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  3. 3
    مؤتمر
    Test Methods for TID Effects on Capacitors

    المؤلفون: Ramamurthy, Chandarasekaran, Anbazhagan, Harrish, Rajeswara, B

    المصدر: 2024 IEEE 42nd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2024 IEEE 42nd. :1-4 Apr, 2024

    Relation: 2024 IEEE 42nd VLSI Test Symposium (VTS)

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  4. 4
    مؤتمر
    Comparison of Simulation and Test Results of Multi-Type Ring Oscillators on Advanced Process Nodes

    المؤلفون: Chen, Kuili, Wang, Jian, Wang, Haiyong, Ouyang, Keqing, Zhou, Guohua

    المصدر: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC) Science and Technology for Integrated Circuits (CSTIC), 2024 Conference of. :1-3 Mar, 2024

    Relation: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC)

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  5. 5
    دورية أكاديمية
    Analysis of VCO-Based Continuous-Time ΣΔ ADCs Using a Subset of Phases as the Feedback Signal

    المؤلفون: Medina, V., Alvero-Gonzalez, L.M., Gutierrez, E., Hernandez, L., Paton, S.

    المصدر: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 71(6):2946-2950 Jun, 2024

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  6. 6
    مؤتمر
    Enhanced Wear-Out Sensor Design in a 12nm Process for Separable Stress Regime Monitoring

    المؤلفون: Hill, Ian, Rendon, Mateo, Ivanov, Andre

    المصدر: 2024 IEEE 42nd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2024 IEEE 42nd. :1-7 Apr, 2024

    Relation: 2024 IEEE 42nd VLSI Test Symposium (VTS)

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  7. 7
    مؤتمر
    A Step-by-Step Layout Transformation Approach to Differentiate How Multiple Layout Dependent Effects Modify Device and Circuit Performance

    المؤلفون: Lu, Luke, Xia, Kejun, van Langevelde, Ronald, McAndrew, Colin C., Li, Wuxia

    المصدر: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-5 Apr, 2024

    Relation: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)

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  8. 8
    مؤتمر
    Harmonic Response of Ring Oscillators under Single ElectroMagnetic Pulsed Fault Injection

    المؤلفون: Amraoui, Sami El, Douadi, Aghiles, Leveugle, Regis, Maistri, Paolo

    المصدر: 2024 IEEE 25th Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2024 IEEE 25th. :1-6 Apr, 2024

    Relation: 2024 IEEE 25th Latin American Test Symposium (LATS)

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  9. 9
    مؤتمر
    An Autonomous Clock Frequency Supervision Circuit

    المؤلفون: Scharwitzl, Clemens, Steininger, Andreas

    المصدر: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) Design & Diagnostics of Electronic Circuits & Systems (DDECS), 2024 27th International Symposium on. :25-30 Apr, 2024

    Relation: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)

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  10. 10
    مؤتمر
    Choose your Path: Control of Ring Oscillators EMFI Susceptibility through FPGA P&R Constraints

    المؤلفون: El Amraoui, Sami, Leveugle, Regis, Maistri, Paolo

    المصدر: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) Design & Diagnostics of Electronic Circuits & Systems (DDECS), 2024 27th International Symposium on. :118-123 Apr, 2024

    Relation: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)

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