المؤلفون: Li, Y, Chen, K, Dang, X, Zhang, F, Tamura, N, Ku, CS, Kang, H, Wenk, HR

المصدر: Journal of Applied Crystallography. 53(5)

مصطلحات موضوعية: scanning Laue X-ray micro-/nanodiffraction, computer programs, crystal orientation maps, strain/stress analysis, texture analysis, Mathematical Sciences, Physical Sciences, Engineering, Inorganic & Nuclear Chemistry

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/63v0q5rp