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المؤلفون: Whitlow, Harry J.
المصدر: Nuclear Instruments and Methods in Physics Research Section B. 540:51-61
مصطلحات موضوعية: Elastic Backscattering Spectroscopy (EBS), Off-axis Scanning Transmission Ion Microscopy (STIM), Proton-proton scattering, Rutherford cross section, Non-Rutherford cross sections, Stopping cross sections, p-12C elastic scattering
وصف الملف: electronic
URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-512187
https://doi.org/10.1016/j.nimb.2023.04.008
https://uu.diva-portal.org/smash/get/diva2:1800961/FULLTEXT01.pdf -
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المؤلفون: Whitlow, Harry J., Nagy, Gyula
المصدر: Nuclear Instruments and Methods in Physics Research Section B. 539:136-140
مصطلحات موضوعية: Pioloform, Polyvinyl butyral (PVB), MeV proton irradiation, Ion microprobe, Scanning Transmission Ion Microscopy (STIM), Elastic Backscattering Spectrometry (EBS)
وصف الملف: electronic
URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-509966
https://uu.diva-portal.org/smash/get/diva2:1792828/FULLTEXT01.pdf -
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المؤلفون: Whitlow, Harry J., Nagy, Gyula, Henderson, Nicholas, Greco, Richard, Deoli, Naresh, Smith, Karen M., Morgan, Karen, Villinger, Francois
المصدر: Nuclear Instruments and Methods in Physics Research Section B. 539:152-161
مصطلحات موضوعية: MeV Ion Microprobe, Off-axis Scanning Transmission Ion Microscopy, (STIM), Particle Induced X-ray Emission (PIXE), Elastic Backscattering Spectrometry (EBS), Nasal mucosa, Ca sequestration, Simian Immunodeficiency Virus (SIV)
وصف الملف: electronic
URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-509273
https://uu.diva-portal.org/smash/get/diva2:1790560/FULLTEXT01.pdf -
4دورية أكاديمية
المؤلفون: Daniel Emmrich, Annalena Wolff, Nikolaus Meyerbröker, Jörg K. N. Lindner, André Beyer, Armin Gölzhäuser
المصدر: Beilstein Journal of Nanotechnology, Vol 12, Iss 1, Pp 222-231 (2021)
مصطلحات موضوعية: carbon nanomembranes, dark field, helium ion microscopy (him), scanning transmission ion microscopy (stim), srim simulations, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2190-4286
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5دورية أكاديمية
المؤلفون: Eduardo Serralta, Nico Klingner, Olivier De Castro, Michael Mousley, Santhana Eswara, Serge Duarte Pinto, Tom Wirtz, Gregor Hlawacek
المصدر: Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 1854-1864 (2020)
مصطلحات موضوعية: bright-field, channeling, dark-field, delay line detector, helium ion microscopy, scanning transmission ion microscopy, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2190-4286
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6دورية أكاديمية
المؤلفون: Michelet-Habchi, C., Incerti, S., Aguer, P., Barberet, Ph., Gontier, E., Guinefolleau, T., Moretto, Ph., Pouthier, A., Pouthier, T., Smith, R.W.
المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 52(3):612-617 Jun, 2005
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7دورية أكاديمية
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تسجيل الدخول للوصول الكامل. -
8دورية أكاديمية
المؤلفون: Huszank, Robert, Csedreki, László, Kertész, Zsófia, Török, Zsófia
المصدر: Journal of Radioanalytical and Nuclear Chemistry: An International Journal Dealing with All Aspects and Applications of Nuclear Chemistry. January 2016 307(1):341-346
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المؤلفون: Armin Gölzhäuser, Nikolaus Meyerbröker, Annalena Wolff, André Beyer, Daniel Emmrich, Jörg K. N. Lindner
المصدر: Beilstein Journal of Nanotechnology, Vol 12, Iss 1, Pp 222-231 (2021)
Beilstein Journal of Nanotechnologyمصطلحات موضوعية: Materials science, Aperture, General Physics and Astronomy, carbon nanomembranes, lcsh:Chemical technology, Signal, lcsh:Technology, Secondary electrons, Full Research Paper, srim simulations, Nanotechnology, General Materials Science, lcsh:TP1-1185, Electrical and Electronic Engineering, helium ion microscopy (him), lcsh:Science, dark field, business.industry, lcsh:T, Detector, scanning transmission ion microscopy (stim), Dark field microscopy, lcsh:QC1-999, Nanoscience, Transmission electron microscopy, Optoelectronics, Acceptance angle, lcsh:Q, business, Field ion microscope, lcsh:Physics
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المؤلفون: Tom Wirtz, Santhana Eswara, Nico Klingner, Serge Duarte Pinto, Olivier De Castro, Eduardo Serralta, Michael Mousley, Gregor Hlawacek
المصدر: Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology 11(2020), 1854-1864
Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 1854-1864 (2020)مصطلحات موضوعية: Materials science, General Physics and Astronomy, bright-field, 02 engineering and technology, lcsh:Chemical technology, 01 natural sciences, Signal, lcsh:Technology, Full Research Paper, scanning transmission ion microscopy, Optics, 0103 physical sciences, bright field, Nanotechnology, General Materials Science, Angular resolution, lcsh:TP1-1185, Electrical and Electronic Engineering, lcsh:Science, dark field, dark-field, 010302 applied physics, Scattering, business.industry, lcsh:T, Detector, delay line detector, Scanning transmission ion microscopy, 021001 nanoscience & nanotechnology, Dark field microscopy, channeling, lcsh:QC1-999, Nanoscience, Temporal resolution, helium ion microscopy, Microchannel plate detector, lcsh:Q, 0210 nano-technology, business, Field ion microscope, lcsh:Physics
وصف الملف: application/pdf