يعرض 1 - 10 نتائج من 604 نتيجة بحث عن '"secondary ion mass spectrometry (SIMS)"', وقت الاستعلام: 1.01s تنقيح النتائج
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    مؤتمر

    المصدر: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-4 Jul, 2023

    Relation: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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    دورية أكاديمية

    المصدر: IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 13(3):391-397 May, 2023

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    دورية أكاديمية

    المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 69(12):2324-2329 Dec, 2022

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    كتاب إلكتروني

    المؤلفون: Chakraborty, PurushottamAff11

    المساهمون: Mudali, U. Kamachi, Series EditorAff1, Ramachandran, Divakar, Editorial Board MemberAff2, Basu, Bikramjit, Editorial Board MemberAff3, Mishra, Suman K., Editorial Board MemberAff4, Prasad, N. Eswara, Editorial Board MemberAff5, Narayana Murty, S.V.S., Editorial Board MemberAff6, Singh, R.N., Editorial Board MemberAff7, Balamuralikrishnan, R., Editorial Board MemberAff8, Ningthoujam, Raghumani S., editorAff9, Tyagi, A. K., editorAff10

    المصدر: Handbook of Materials Science, Volume 1 : Optical Materials. :639-683

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    دورية أكاديمية
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    دورية أكاديمية
  8. 8
    دورية أكاديمية
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    دورية أكاديمية
  10. 10
    مؤتمر

    المصدر: 2018 International Conference on Recent Innovations in Electrical, Electronics & Communication Engineering (ICRIEECE) Recent Innovations in Electrical, Electronics & Communication Engineering (ICRIEECE), 2018 International Conference on. :1083-1086 Jul, 2018

    Relation: 2018 International Conference on Recent Innovations in Electrical, Electronics & Communication Engineering (ICRIEECE)