المؤلفون: Lepri, N., Gibertini, P., Mannocci, P., Pirovano, A., Tortorelli, I., Fantini, P., Ielmini, D.

المصدر: 2023 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2023 IEEE International. :1-4 May, 2023

Relation: 2023 IEEE International Memory Workshop (IMW)

المؤلفون: Ambrosi, E., Wu, C., Lee, H., Lee, C., Hsu, C., Chang, C., Lee, T., Bao, X.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 43(10):1673-1676 Oct, 2022

المؤلفون: Youssef, Amr Nabil, Jagath, Arya Lekshmi, Thulasiraman, Nandha Kumar, Almurib, Haider Abbas F.

المصدر: 2021 IEEE 19th Student Conference on Research and Development (SCOReD) Research and Development (SCOReD), 2021 IEEE 19th Student Conference on. :267-272 Nov, 2021

Relation: 2021 IEEE 19th Student Conference on Research and Development (SCOReD)

المؤلفون: Yoo, Kyoung-Joung, Kang, Dae-Yun, Kim, Nahyun, Lee, Ho-Jin, Kim, Ta-Hyeong, Kim, Taeho, Kim, Tae Geun^{Aff1, IDs12598023023987_cor7}

المصدر: Rare Metals. 43(1):280-288

المؤلفون: Dilna, U, Prasad, S N

المصدر: 2020 Third International Conference on Multimedia Processing, Communication & Information Technology (MPCIT) Multimedia Processing, Communication & Information Technology (MPCIT), 2020 Third International Conference on. :138-145 Dec, 2020

Relation: 2020 Third International Conference on Multimedia Processing, Communication & Information Technology (MPCIT)

المؤلفون: Lele, Ashwin Sanjay, Naik, Anand, Bandhu, Lakshya, Das, Bhaskar, Ganguly, Udayan

المصدر: 2020 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2020 IEEE International Symposium on. :1-5 Oct, 2020

Relation: 2020 IEEE International Symposium on Circuits and Systems (ISCAS)

المؤلفون: Heittmann, Arne, Noll, Tobias G.

المصدر: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018. :1496-1499 Mar, 2018

Relation: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Woo, J., Yu, S.

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 27(9):2205-2212 Sep, 2019

المؤلفون: Wang, W., Laudato, M., Ambrosi, E., Bricalli, A., Covi, E., Lin, Y., Ielmini, D.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(9):3795-3801 Sep, 2019

المؤلفون: Woo, J., Yu, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(12):5549-5553 Dec, 2018